Growth Kinetics of Thin-Film Cadmium Sulfide by Ammonia-Thiourea Based CBD

2004 ◽  
Vol 151 (10) ◽  
pp. C655 ◽  
Author(s):  
C. Voss ◽  
Y.-J. Chang ◽  
S. Subramanian ◽  
S. O. Ryu ◽  
T.-J. Lee ◽  
...  
Keyword(s):  
Thin Film ◽  
Cadmium Sulfide ◽  
Growth Kinetics ◽  
Kinetics Of

Thermal stability and growth kinetics of Co2Si and CoSi in thin‐film reactions

1982 ◽  
Vol 53 (6) ◽  
pp. 4406-4410 ◽  
Author(s):  
K. N. Tu ◽  
G. Ottaviani ◽  
R. D. Thompson ◽  
J. W. Mayer
Keyword(s):  
Thin Film ◽  
Thermal Stability ◽  
Growth Kinetics ◽  
Kinetics Of

X-ray photoelectron spectroscopy study of the growth kinetics of biomimetically grown hydroxyapatite thin-film coatings

2010 ◽  
Vol 256 (23) ◽  
pp. 7178-7185 ◽  
Author(s):  
K. McLeod ◽  
S. Kumar ◽  
N.K. Dutta ◽  
R.St.C. Smart ◽  
N.H. Voelcker ◽  
...  
Keyword(s):  
Thin Film ◽  
Growth Kinetics ◽  
Photoelectron Spectroscopy ◽  
Spectroscopy Study ◽  
X Ray ◽  
Film Coatings ◽  
Thin Film Coatings ◽  
Kinetics Of

Growth kinetics of the θ phase in AlCu thin film bilayers

1978 ◽  
Vol 52 (1) ◽  
pp. 97-101 ◽  
Author(s):  
S.U. Campisano ◽  
E. Costanzo ◽  
F. Scaccianoce ◽  
R. Cristofolini
Keyword(s):  
Thin Film ◽  
Growth Kinetics ◽  
Cu Thin Film ◽  
Kinetics Of

Early Stages Of Reaction Between Amorphous Ni-Nb And Crystalline Au Films

1985 ◽  
Vol 54 ◽  
Author(s):  
E. A. Dobisz ◽  
H. G. Craighead ◽  
J. H. Perepezko ◽  
J. D. Wiley ◽  
B. L. Doyle ◽  
...  
Keyword(s):  
Thin Film ◽  
Cross Section ◽  
Ternary Compound ◽  
Growth Kinetics ◽  
Depth Resolution ◽  
Compound Layer ◽  
Rutherford Backscattering ◽  
Early Stages ◽  
Kinetics Of ◽  
High Depth

ABSTRACTThin film interactions between a-(Ni-Nb) and polycrystalline Au over-layers have been studied with high depth resolution (≤1.7nm) Rutherford backscattering (RBS) and TEM to obtain information on the early stages of reaction at the interface. The RBS spectra from Au indicated that the interdiffused samples consisted of two layers: an Au-Nb binary layer on the surface and a ternary Au-Ni-Nb compound layer beneath the binary layer. The growth kinetics of the ternary compound layer differed in samples which had been relaxed prior to Au deposition from the kinetics for unrelaxed samples. Furthermore, cross section TEM micrographs showed that relaxed and unrelaxed samples exhibit different microstructures after the early stages, of annealing. We interpret this result to indicate that the reaction stages in relaxed samples are not as advanced as those in the unrelaxed samples.

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