Internal probing of submicron FETs and photoemission using individual oxide traps

1990 ◽  
Vol 34 (2.3) ◽  
pp. 227-242 ◽  
Author(s):  
Phillip Restle ◽  
Antonio Gnudi
Keyword(s):  
Oxide Traps ◽  
Individual Oxide

Individual oxide traps as probes into submicron devices

1988 ◽  
Vol 53 (19) ◽  
pp. 1862-1864 ◽  
Author(s):  
Phillip Restle
Keyword(s):  
Submicron Devices ◽  
Oxide Traps ◽  
Individual Oxide

scholarly journals Paramagnetic oxide traps in Sc2O3-passivated (100)Ge/HfO2 stacks

2015 ◽  
Vol 147 ◽  
pp. 180-183 ◽  
Author(s):  
A. Stesmans ◽  
S. Iacovo ◽  
D. Cott ◽  
A. Thean ◽  
H. Arimura ◽  
...  
Keyword(s):  
Oxide Traps

Observation and characterization of near-interface oxide traps with C-V techniques

1995 ◽  
Vol 42 (11) ◽  
pp. 2004-2009 ◽  
Author(s):  
N.L. Cohen ◽  
R.E. Paulsen ◽  
M.H. White
Keyword(s):  
Oxide Traps

Transient-Current Method for Measurement of Active Near-Interface Oxide Traps in 4H-SiC MOS Capacitors and MOSFETs

2015 ◽  
Vol 62 (8) ◽  
pp. 2670-2674 ◽  
Author(s):  
Hamid Amini Moghadam ◽  
Sima Dimitrijev ◽  
Jisheng Han ◽  
Daniel Haasmann ◽  
Amirhossein Aminbeidokhti
Keyword(s):  
Current Method ◽  
Transient Current ◽  
Mos Capacitors ◽  
Oxide Traps

Plasma passivation of near-interface oxide traps and voltage stability in SiC MOS capacitors

2019 ◽  
Vol 125 (18) ◽  
pp. 185703 ◽  
Author(s):  
Yunong Sun ◽  
Chao Yang ◽  
Zhipeng Yin ◽  
Fuwen Qin ◽  
Dejun Wang
Keyword(s):  
Voltage Stability ◽  
Mos Capacitors ◽  
Plasma Passivation ◽  
Oxide Traps

An advanced description of oxide traps in MOS transistors and its relation to DFT

2010 ◽  
Vol 9 (3-4) ◽  
pp. 135-140 ◽  
Author(s):  
F. Schanovsky ◽  
W. Gös ◽  
T. Grasser
Keyword(s):  
Mos Transistors ◽  
Oxide Traps
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