Observation and characterization of near-interface oxide traps with C-V techniques

1995 ◽  
Vol 42 (11) ◽  
pp. 2004-2009 ◽  
Author(s):  
N.L. Cohen ◽  
R.E. Paulsen ◽  
M.H. White
Keyword(s):  
Oxide Traps

(Invited) Characterization of Oxide Traps Participating in Random Telegraph Noise Using Charging History Effects in Nano-Scaled MOSFETs

2013 ◽  
Vol 58 (9) ◽  
pp. 265-279 ◽  
Author(s):  
T. Tsuchiya ◽  
N. Tamura ◽  
A. Sakakidani ◽  
K. Sonoda ◽  
M. Kamei ◽  
...  
Keyword(s):  
Random Telegraph Noise ◽  
History Effects ◽  
Telegraph Noise ◽  
Oxide Traps

Electrical and Optical Spectroscopic Characterization of Oxide Traps Induced by Hot Hole Injection

ESSDERC ’89 ◽  
1989 ◽  
pp. 549-552
Author(s):  
M. Bourcerie ◽  
J.-C. Marchetaux ◽  
A. Boudou ◽  
D. Vuillaume
Keyword(s):  
Spectroscopic Characterization ◽  
Hole Injection ◽  
Oxide Traps

Application of 1/f noise measurements to the characterization of near-interface oxide traps in ULSI n-MOSFETs

1998 ◽  
Vol 38 (12) ◽  
pp. 1919-1923 ◽  
Author(s):  
S. Villa ◽  
G. De Geronimo ◽  
A. Pacelli ◽  
A.L. Lacaita ◽  
A. Longoni
Keyword(s):  
Noise Measurements ◽  
Oxide Traps

Characterization of oxide traps in 0.15 μm2 MOSFETs using random telegraph signals

2000 ◽  
Vol 40 (11) ◽  
pp. 1875-1881 ◽  
Author(s):  
Nuditha Vibhavie Amarasinghe ◽  
Zeynep Çelik-Butler ◽  
Petr Vasina
Keyword(s):  
Random Telegraph Signals ◽  
Oxide Traps
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