CCD Image Sensors For High Speed Inspection Systems

1988 ◽  
Author(s):  
Savvas G. Chamberlain ◽  
William D. Washkurak ◽  
Brian C. Doody
Keyword(s):  
High Speed ◽  
Image Sensors ◽  
Inspection Systems ◽  
Ccd Image

High Speed Document Scanner Using Charge Coupled Device (CCD) Image Sensors

1983 ◽  
Author(s):  
Masahiro Mori ◽  
Isao Kondo ◽  
Masakatsu Horie
Keyword(s):  
High Speed ◽  
Image Sensors ◽  
Charge Coupled Device ◽  
Ccd Image

Preliminary Characterization of Two High-Speed, Back-Illuminated CCD Image Sensors

2004 ◽  
pp. 33-40
Author(s):  
Morley M. Blouke ◽  
Denis L. Heidtmann ◽  
James Eriksen ◽  
Archibald Barter
Keyword(s):  
High Speed ◽  
Image Sensors ◽  
Preliminary Characterization ◽  
Ccd Image ◽  
Back Illuminated

Ultra High Speed CCD Image Sensors For Scanning Applications

1989 ◽  
Author(s):  
Brian C. Doody ◽  
N. Daryl Prince ◽  
Jeff Sainio
Keyword(s):  
High Speed ◽  
Image Sensors ◽  
Ultra High Speed ◽  
Ccd Image

Simulation for estimating smear noise and sensitivity of CCD image sensors having square pixels less than 2.0 μm

2007 ◽  
Author(s):  
Koji Kikuchi ◽  
Shinji Miyazawa ◽  
Yoshinori Uchida ◽  
Hiroe Kamata ◽  
Teruo Hirayama
Keyword(s):  
Image Sensors ◽  
Ccd Image

Advanced complementary color filter technology without dyeing process for CCD image sensors

1998 ◽  
Author(s):  
Hiromitsu Aoki ◽  
Kenji Yokozawa ◽  
Nobuyuki Waga ◽  
Tomoko Ohtagaki ◽  
Yoshiaki Nishi ◽  
...  
Keyword(s):  
Image Sensors ◽  
Color Filter ◽  
Dyeing Process ◽  
Complementary Color ◽  
Ccd Image

Dynamic range enhancement in high-speed image sensors

2000 ◽  
Author(s):  
S. E. Alexandrov ◽  
Gennadii A. Gavrilov ◽  
V. K. Gusev ◽  
E. E. Mukhin ◽  
Galina Y. Sotnikova
Keyword(s):  
High Speed ◽  
Dynamic Range ◽  
Image Sensors

Automatic Optical Inspection and Laser Cleaning of Image Sensors

2007 ◽  
Vol 364-366 ◽  
pp. 104-107
Author(s):  
Jong Myoung Lee ◽  
Un Chung Cho
Keyword(s):  
Image Sensors ◽  
Intense Laser ◽  
Laser Shock ◽  
Dry Cleaning ◽  
Image Sensing ◽  
Vision Inspection ◽  
Optical Inspection ◽  
Before And After ◽  
Wave Induced ◽  
Ccd Image

A new dry cleaning methodology named laser shock cleaning and optical inspection technique has been applied not only to remove the particles from the surfaces of image sensors but also to inspect the surfaces automatically before or after the cleaning. In the packaging of CMOS and CCD image sensing modules, the particles generated during the assembly process should be removed from the surfaces of image sensors in order to ensure clear image as well as to enhance the yield. The different kinds of particles were removed from the surfaces by the laser shock cleaning technique which utilizes the airborne shock wave induced by intense laser pulse. For the quantitative evaluation of cleaning performance, number, shape and size of the particles on the surfaces of image sensors were measured by vision inspection technique before and after cleaning. It was found that most particles on the surfaces were successfully removed after the treatment of laser-induced shock waves. The average removal efficiency of the particles was over 95 %. It is interestingly found that the remaining particles after the cleaning are based on organics, which are probably attached during the bonding process.

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