IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest.
Latest Publications

TOTAL DOCUMENTS

296

(FIVE YEARS 0)

H-INDEX

(FIVE YEARS 0)

Published By IEEE

078039268x

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

High speed toggle MRAM with mgO-based tunnel junctions

IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. ◽

10.1109/iedm.2005.1609496 ◽

2006 ◽

Cited By ~ 14

Author(s):

J.M. Slaughter ◽

R.W. Dave ◽

M. Durlam ◽

G. Kerszykowski ◽

K. Smith ◽

...

Keyword(s):

High Speed ◽

Tunnel Junctions

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Modulation of the Ni FUSI workfunction by Yb doping: from midgap to n-type band-edge

IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. ◽

10.1109/iedm.2005.1609429 ◽

2006 ◽

Cited By ~ 2

Author(s):

H.Y. Yu ◽

J.D. Chen ◽

M.F. Li ◽

S.J. Lee ◽

D.L. Kwong ◽

...

Keyword(s):

Band Edge ◽

Type Band

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Quantum, power, and compound semiconductor devices high performance si-rf power and power-switching devices

IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. ◽

10.1109/iedm.2005.1609350 ◽

2006 ◽

Author(s):

H. Brech ◽

Y. Hoshino

Keyword(s):

High Performance ◽

Semiconductor Devices ◽

Compound Semiconductor ◽

Rf Power ◽

Power Switching ◽

Switching Devices

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Influence of terrestrial cosmic rays on the reliability of CCD image sensors

IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. ◽

10.1109/iedm.2005.1609479 ◽

2006 ◽

Cited By ~ 3

Author(s):

A.J.P. Theuwissen

Keyword(s):

Cosmic Rays ◽

Image Sensors ◽

Ccd Image

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Emerging technologies flexible electronics

IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. ◽

10.1109/iedm.2005.1609372 ◽

2006 ◽

Cited By ~ 2

Author(s):

V. Misra

Keyword(s):

Flexible Electronics ◽

Emerging Technologies

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High density and high speed SRAM bit-cells and ring oscillators due to laser annealing for 45nm bulk CMOS

IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. ◽

10.1109/iedm.2005.1609438 ◽

2006 ◽

Cited By ~ 8

Author(s):

A. Pouydebasque ◽

B. Dumont ◽

S. Denorme ◽

F. Wacquant ◽

M. Bidaud ◽

...

Keyword(s):

High Speed ◽

Laser Annealing ◽

High Density ◽

Ring Oscillators

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High performance 30 nm gate bulk CMOS for 45 nm node with σ-shaped SiGe-SD

IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. ◽

10.1109/iedm.2005.1609316 ◽

2006 ◽

Cited By ~ 10

Author(s):

H. Ohta ◽

Y. Kim ◽

Y. Shimamune ◽

T. Sakuma ◽

A. Hatada ◽

...

Keyword(s):

High Performance

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Detectors, sensors, and MEMS - MEMS technologies and applications

IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. ◽

10.1109/iedm.2005.1609326 ◽

2006 ◽

Author(s):

D. Young ◽

J. Brugger

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Technology for sub-50nm DRAM and NAND flash manufacturing

IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. ◽

10.1109/iedm.2005.1609340 ◽

2006 ◽

Cited By ~ 47

Author(s):

Kinam Kim

Keyword(s):

Nand Flash

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Analysis and implications of ic cooling for deep nanometer scale cmos technologies

IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. ◽

10.1109/iedm.2005.1609537 ◽

2006 ◽

Cited By ~ 1

Author(s):

Sheng-Chih Lin ◽

R. Mahajan ◽

Vivek De ◽

K. Banerjee

Keyword(s):

Nanometer Scale ◽

Ic Cooling

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IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest.Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

High speed toggle MRAM with mgO-based tunnel junctions

Modulation of the Ni FUSI workfunction by Yb doping: from midgap to n-type band-edge

Quantum, power, and compound semiconductor devices high performance si-rf power and power-switching devices

Influence of terrestrial cosmic rays on the reliability of CCD image sensors

Emerging technologies flexible electronics

High density and high speed SRAM bit-cells and ring oscillators due to laser annealing for 45nm bulk CMOS

High performance 30 nm gate bulk CMOS for 45 nm node with σ-shaped SiGe-SD

Detectors, sensors, and MEMS - MEMS technologies and applications

Technology for sub-50nm DRAM and NAND flash manufacturing

Analysis and implications of ic cooling for deep nanometer scale cmos technologies

IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest.
Latest Publications