scholarly journals Nonlinear time dependence of dark current in charge-coupled devices

2011 ◽  
Author(s):  
Justin C. Dunlap ◽  
Erik Bodegom ◽  
Ralf Widenhorn
Keyword(s):  
Time Dependence ◽  
Dark Current ◽  
Charge Coupled Devices

scholarly journals Meyer–Neldel rule for dark current in charge-coupled devices

2001 ◽  
Vol 89 (12) ◽  
pp. 8179-8182 ◽  
Author(s):  
Ralf Widenhorn ◽  
Lars Mündermann ◽  
Armin Rest ◽  
Erik Bodegom
Keyword(s):  
Dark Current ◽  
Charge Coupled Devices

Radiation-Induced Deep-Level Traps in CCD Image Sensors

2007 ◽  
Vol 994 ◽  
Author(s):  
Cristian Tivarus ◽  
William C. McColgin
Keyword(s):  
Dark Current ◽  
Deep Level ◽  
Image Sensors ◽  
Charge Coupled Devices ◽  
Radiation Induced ◽  
Ccd Image ◽  
Silicon Defects

AbstractDark current spectroscopy (DCS) is used to study deep level traps corresponding to the bright pixels that form the histogram “tails” of irradiated charge-coupled devices (CCD). We found four distinct traps, among which the double vacancy (V2) and the vacancy-phosphorous (VP) have the highest concentrations and generation rates. We show that DCS can be used to examine the annealing mechanisms of silicon defects to concentrations as low as 5 × 107 cm−3.

Exposure Time Dependence of Dark Current in CCD Imagers

2010 ◽  
Vol 57 (3) ◽  
pp. 581-587 ◽  
Author(s):  
Ralf Widenhorn ◽  
Justin C. Dunlap ◽  
Erik Bodegom
Keyword(s):  
Time Dependence ◽  
Exposure Time ◽  
Dark Current

scholarly journals Low dark current, back-illuminated charge coupled devices

2009 ◽  
Author(s):  
R. C. Westhoff ◽  
B. E. Burke ◽  
H. R. Clark ◽  
A. H. Loomis ◽  
D. J. Young ◽  
...  
Keyword(s):  
Dark Current ◽  
Charge Coupled Devices ◽  
Back Illuminated

Characterization of dark current non-uniformities in charge-coupled devices

1984 ◽  
Vol 27 (2) ◽  
pp. 147-154 ◽  
Author(s):  
J. van der Spiegel ◽  
G.J. Declerck
Keyword(s):  
Dark Current ◽  
Charge Coupled Devices

The O–C diagrams of minor planets − a new approach to modelling the rotation

1999 ◽  
Vol 173 ◽  
pp. 185-188
Author(s):  
Gy. Szabó ◽  
K. Sárneczky ◽  
L.L. Kiss
Keyword(s):  
Error Analysis ◽  
Time Dependence ◽  
Theoretical Work ◽  
Minor Planet ◽  
Minor Planets ◽  
New Approach ◽  
Preliminary Results ◽  
Ccd Observations

AbstractA widely used tool in studying quasi-monoperiodic processes is the O–C diagram. This paper deals with the application of this diagram in minor planet studies. The main difference between our approach and the classical O–C diagram is that we transform the epoch (=time) dependence into the geocentric longitude domain. We outline a rotation modelling using this modified O–C and illustrate the abilities with detailed error analysis. The primary assumption, that the monotonity and the shape of this diagram is (almost) independent of the geometry of the asteroids is discussed and tested. The monotonity enables an unambiguous distinction between the prograde and retrograde rotation, thus the four-fold (or in some cases the two-fold) ambiguities can be avoided. This turned out to be the main advantage of the O–C examination. As an extension to the theoretical work, we present some preliminary results on 1727 Mette based on new CCD observations.

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