Exposure Time Dependence of Dark Current in CCD Imagers

2010 ◽  
Vol 57 (3) ◽  
pp. 581-587 ◽  
Author(s):  
Ralf Widenhorn ◽  
Justin C. Dunlap ◽  
Erik Bodegom
1996 ◽  
Vol 22 (1) ◽  
pp. 139-141 ◽  
Author(s):  
C.H. Raeman ◽  
S.Z. Child ◽  
D. Dalecki ◽  
C. Cox ◽  
E.L. Carstensen

2008 ◽  
Vol 86 ◽  
pp. 0-0
Author(s):  
R AL-SAQRY ◽  
K GALICHANIN ◽  
Y LI ◽  
PG SÖDERBERG ◽  
K SCHULMEISTER ◽  
...  

2011 ◽  
Author(s):  
Justin C. Dunlap ◽  
Erik Bodegom ◽  
Ralf Widenhorn

Author(s):  
L. V. Prokopenko ◽  
N. N. Courierov ◽  
A. V. Lagutina

The study presents the results of studying the formation of excess risk under the action of noise during the length of service, depending on the level of noise exposure. Excess risk has linearly depending on the magnitude of the weighted sound pressure over a wide range of sound pressures.


2019 ◽  
Vol 19 ◽  
pp. 161-165
Author(s):  
Y. Yang ◽  
L. Buzi ◽  
A.O. Nelson ◽  
R. Kaita ◽  
B.E. Koel

2015 ◽  
Vol 88 (2) ◽  
pp. 330-332 ◽  
Author(s):  
Yuhi Inada ◽  
Toru Amaya ◽  
Akinori Saeki ◽  
Shu Seki ◽  
Toshikazu Hirao

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