Evaluation of a high-performance chemically amplified resist for EUVL mask fabrication

Author(s):  
Bing Lu ◽  
Eric Weisbrod ◽  
Pawitter J. S. Mangat ◽  
Kevin J. Nordquist ◽  
Eric S. Ainley
2001 ◽  
Vol 705 ◽  
Author(s):  
J.R. Maldonado ◽  
M. Angelopoulos ◽  
W. Huang ◽  
R. L. Brainard ◽  
J. M. Guevremont ◽  
...  

AbstractThis paper describes stable, high sensitivity (5-10 μC/cm2 at 50 kV) e-beam resist systems utilizing chemical amplification suitable for mask fabrication for device generations below 100 nm. In particular, two resist systems with improved performance for mask fabrication developed in a joint program by Etec, IBM and Shipley will be described: a Si- doped version of the IBM KRS-XE resist (now commercially available) developed at IBM Research, and a new MANA resist developed at Shipley. Commercialization issues for mask e-beam resists also will be discussed.


2001 ◽  
Author(s):  
Benjamen M. Rathsack ◽  
Cyrus E. Tabery ◽  
Jeff A. Albelo ◽  
Peter D. Buck ◽  
C. Grant Willson

1999 ◽  
Author(s):  
Janet M. Rocque ◽  
Michael J. Lercel ◽  
Cameron J. Brooks ◽  
Richard W. Henry ◽  
Douglas E. Benoit

1998 ◽  
Author(s):  
Hideaki Mochizuki ◽  
Hiroshi Tomiyasu ◽  
Yasuhiro Kameyama ◽  
Michinori Tsukamoto ◽  
Takaaki Niinomi ◽  
...  

2005 ◽  
Author(s):  
Sin-Ju Yang ◽  
Sung-Min Seo ◽  
Sang-Hoon Ko ◽  
Han-Sun Cha ◽  
Geung-Won Kang ◽  
...  

2001 ◽  
Author(s):  
Christopher Magg ◽  
Michael J. Lercel ◽  
Mark Lawliss ◽  
Ranee W. Kwong ◽  
Wu-Song Huang ◽  
...  

2001 ◽  
Author(s):  
Bing Lu ◽  
Zorian S. Masnyj ◽  
Pawitter J. S. Mangat ◽  
Kevin J. Nordquist ◽  
Eric S. Ainley ◽  
...  

1996 ◽  
Author(s):  
Takaaki Niinomi ◽  
Hiroshi Tomiyasu ◽  
Yasuhiro Kameyama ◽  
Michinori Tsukamoto ◽  
Yuki Tanaka ◽  
...  

1998 ◽  
Author(s):  
Medhat A. Toukhy ◽  
Sanjay Malik ◽  
Andrew J. Blakeney ◽  
Karin R. Schlicht

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