Resist composition effects on ultimate resolution of negative-tone chemically amplified resists

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Laurent Pain ◽  
C. Gourgon ◽  
K. Patterson ◽  
B. Scarfogliere ◽  
Serge V. Tedesco ◽  
...  
2003 ◽  
Author(s):  
Mathias Irmscher ◽  
Lothar Berger ◽  
Dirk Beyer ◽  
Joerg Butschke ◽  
Peter Dress ◽  
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2004 ◽  
Vol 43 (6B) ◽  
pp. 3974-3980 ◽  
Author(s):  
S. Landis ◽  
S. Pauliac ◽  
J. Saint-Pol ◽  
C. Gourgon ◽  
M. Akita ◽  
...  

2013 ◽  
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Prashant K. Kulshreshtha ◽  
Ken Maruyama ◽  
Sara Kiani ◽  
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Pradeep Perera ◽  
...  

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