Dynamic behavior of internal elements of high-frequency integrated circuits studied by time-resolved optical-beam-induced current (OBIC) method

1991 ◽  
Author(s):  
Harald Bergner ◽  
Klaus Hempel ◽  
Uwe Stamm
Keyword(s):  
Integrated Circuits ◽  
Dynamic Behavior ◽  
High Frequency ◽  
Optical Beam ◽  
Induced Current ◽  
Time Resolved ◽  
Optical Beam Induced Current

An Analytical Technique to Assess the Risk of Laser Damage to Encapsulated Integrated Circuits during Package Laser Marking

2008 ◽  
Author(s):  
Joseph Patterson ◽  
Cliff Schuring
Keyword(s):  
Integrated Circuits ◽  
Optical Beam ◽  
Laser Damage ◽  
Induced Current ◽  
Induced Voltage ◽  
Laser Marking ◽  
Thermally Induced ◽  
Analytical Technique ◽  
Optical Beam Induced Current

Abstract Damage to encapsulated integrated circuits has recently been reported due to Laser marking of the package. A method to assess the risk of such damage is presented. The method is an analytical technique using Thermally Induced Voltage Alteration (XIVA) and Optical Beam Induced Current (OBIC) imaging.

A time-resolved optical beam induced current method

1990 ◽  
Vol 12 (1-4) ◽  
pp. 143-148 ◽  
Author(s):  
Harald Bergner ◽  
Tobias Damm ◽  
Uwe Stamm ◽  
Klaus-Peter Stolberg
Keyword(s):  
Current Method ◽  
Optical Beam ◽  
Induced Current ◽  
Time Resolved ◽  
Optical Beam Induced Current
Sign in / Sign up

Export Citation Format

Share Document