Two-photon optical beam induced current imaging through the backside of integrated circuits

1997 ◽  
Vol 71 (18) ◽  
pp. 2578-2580 ◽  
Author(s):  
Chris Xu ◽  
Winfried Denk
Keyword(s):  
Integrated Circuits ◽  
Optical Beam ◽  
Induced Current ◽  
Two Photon ◽  
Optical Beam Induced Current

An Analytical Technique to Assess the Risk of Laser Damage to Encapsulated Integrated Circuits during Package Laser Marking

2008 ◽  
Author(s):  
Joseph Patterson ◽  
Cliff Schuring
Keyword(s):  
Integrated Circuits ◽  
Optical Beam ◽  
Laser Damage ◽  
Induced Current ◽  
Induced Voltage ◽  
Laser Marking ◽  
Thermally Induced ◽  
Analytical Technique ◽  
Optical Beam Induced Current

Abstract Damage to encapsulated integrated circuits has recently been reported due to Laser marking of the package. A method to assess the risk of such damage is presented. The method is an analytical technique using Thermally Induced Voltage Alteration (XIVA) and Optical Beam Induced Current (OBIC) imaging.

scholarly journals Two-photon optical-beam-induced current imaging of indium gallium nitride blue light-emitting diodes

1999 ◽  
Vol 24 (20) ◽  
pp. 1407 ◽  
Author(s):  
Fu-Jen Kao ◽  
Mao-Kuo Huang ◽  
Yung-Shun Wang ◽  
Sheng-Lung Huang ◽  
Ming-Kwei Lee ◽  
...  
Keyword(s):  
Gallium Nitride ◽  
Blue Light ◽  
Indium Gallium Nitride ◽  
Light Emitting Diodes ◽  
Optical Beam ◽  
Induced Current ◽  
Light Emitting ◽  
Two Photon ◽  
Indium Gallium ◽  
Optical Beam Induced Current
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