Damage introduction in GaAs/AlGaAs and InGaAs/InP heterojunction bipolar transistor structures during electron cyclotron resonance plasma processing

1993 ◽  
Vol 11 (4) ◽  
pp. 1768-1771 ◽  
Author(s):  
F. Ren ◽  
T. R. Fullowan ◽  
S. J. Pearton ◽  
J. R. Lothian ◽  
R. Esagui ◽  
...  
1990 ◽  
Vol 56 (15) ◽  
pp. 1424-1426 ◽  
Author(s):  
S. J. Pearton ◽  
U. K. Chakrabarti ◽  
A. P. Kinsella ◽  
D. Johnson ◽  
C. Constantine

Sign in / Sign up

Export Citation Format

Share Document