Magnetic field enhanced reactive ion etching of polyimide

1984 ◽  
Vol 2 (3) ◽  
pp. 1292-1295 ◽  
Author(s):  
J. T. C. Yeh ◽  
K. R. Grebe ◽  
M. J. Palmer
1994 ◽  
Author(s):  
Masafumi Tanabe ◽  
Akio Matsuda ◽  
Takeshi Sunada ◽  
Taro Nomura ◽  
Hideki Fujimoto ◽  
...  

CIRP Annals ◽  
2010 ◽  
Vol 59 (1) ◽  
pp. 351-354 ◽  
Author(s):  
H. Yamaguchi ◽  
R.E. Riveros ◽  
I. Mitsuishi ◽  
U. Takagi ◽  
Y. Ezoe ◽  
...  

2004 ◽  
Vol 16 (4) ◽  
pp. 291-296 ◽  
Author(s):  
S. B. Clendenning ◽  
S. Han ◽  
N. Coombs ◽  
C. Paquet ◽  
M. S. Rayat ◽  
...  

1994 ◽  
Vol 33 (Part 1, No. 4B) ◽  
pp. 2194-2199 ◽  
Author(s):  
Satoshi Nakagawa ◽  
Tomoyuki Sasaki ◽  
Hajime Mori ◽  
Takashi Namura

1991 ◽  
Vol 69 (1) ◽  
pp. 447-451
Author(s):  
Haewook Han ◽  
Ki‐Woong Whang

1986 ◽  
Vol 68 ◽  
Author(s):  
Scott Bell ◽  
Thijs Bril

AbstractA method of forming a uniform magnetic field in a modified hexode type etch system is described.Experimental results of etching Si, SiO2 and photoresist with NF3 are presented.The magnetic field effectively increases the ion flux and decreases the energy of the ions bombarding the cathode.It was found that adding a magnetic field increases the etchrate of Si for the conditions studied, but for SiO2 and photoresist, the decreased ion bombardment energy leads to lower etchrates under certain conditions.The resulting effect on selectivities is discussed.


2015 ◽  
Vol 58 (10) ◽  
pp. 392-396 ◽  
Author(s):  
Taisei MOTOMURA ◽  
Kazunori TAKAHASHI ◽  
Yuji KASASHIMA ◽  
Fumihiko UESUGI ◽  
Akira ANDO

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