Controlling the threshold voltage of a metal–oxide–semiconductor field effect transistor by molecular protonation of the Si:SiO[sub 2] interface
2002 ◽
Vol 20
(4)
◽
pp. 1706
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2002 ◽
Vol 41
(Part 1, No. 7A)
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pp. 4484-4488
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2015 ◽
Vol 29
(2)
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pp. 230-242
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2006 ◽
Vol 45
(4B)
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pp. 3074-3078
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