Static test compaction for transition faults under the hazard-based detection conditions

2012 IEEE 30th VLSI Test Symposium (VTS) ◽

10.1109/vts.2012.6231099 ◽

2012 ◽

Author(s):

Irith Pomeranz

Keyword(s):

Static Test ◽

Test Compaction ◽

Transition Faults

Download Full-text

POSTT: Path-oriented static test compaction for transition faults in scan circuits

2017 IEEE International Test Conference (ITC) ◽

10.1109/test.2017.8242073 ◽

2017 ◽

Author(s):

Irith Pomeranz

Keyword(s):

Static Test ◽

Test Compaction ◽

Transition Faults ◽

Scan Circuits

Download Full-text

Static Test Compaction using Independent Suffixes of a Transparent-Scan Sequence

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/tcad.2021.3073625 ◽

2021 ◽

pp. 1-1

Author(s):

Irith Pomeranz

Keyword(s):

Static Test ◽

Test Compaction

Download Full-text

A static test compaction technique for combinational circuits based on independent fault clustering

10th IEEE International Conference on Electronics, Circuits and Systems, 2003. ICECS 2003. Proceedings of the 2003 ◽

10.1109/icecs.2003.1301757 ◽

2004 ◽

Cited By ~ 2

Author(s):

Y.E. Osais ◽

A.H. El-Maleh

Keyword(s):

Combinational Circuits ◽

Static Test ◽

Test Compaction

Download Full-text

Test Compaction for Transition Faults under Transparent-Scan

Proceedings of the Design Automation & Test in Europe Conference ◽

10.1109/date.2006.244098 ◽

2006 ◽

Cited By ~ 2

Author(s):

I. Pomeranz ◽

S.M. Reddy

Keyword(s):

Test Compaction ◽

Transition Faults

Download Full-text

Static test compaction for scan-based designs to reduce test application time

Proceedings Seventh Asian Test Symposium (ATS'98) (Cat. No.98TB100259) ◽

10.1109/ats.1998.741614 ◽

2002 ◽

Cited By ~ 37

Author(s):

I. Pomeranz ◽

S.M. Reddy

Keyword(s):

Application Time ◽

Static Test ◽

Test Compaction ◽

Test Application Time ◽

Test Application

Download Full-text

Restoration-Based Procedures With Set Covering Heuristics for Static Test Compaction of Functional Test Sequences

IEEE Transactions on Very Large Scale Integration (VLSI) Systems ◽

10.1109/tvlsi.2013.2253499 ◽

2014 ◽

Vol 22 (4) ◽

pp. 779-791 ◽

Cited By ~ 6

Author(s):

Irith Pomeranz

Keyword(s):

Functional Test ◽

Set Covering ◽

Static Test ◽

Test Compaction

Download Full-text

Switching Activity as a Test Compaction Heuristic for Transition Faults

IEEE Transactions on Very Large Scale Integration (VLSI) Systems ◽

10.1109/tvlsi.2009.2022474 ◽

2010 ◽

Vol 18 (9) ◽

pp. 1357-1361 ◽

Cited By ~ 11

Author(s):

Irith Pomeranz ◽

Sudhakar M. Reddy

Keyword(s):

Switching Activity ◽

Test Compaction ◽

Transition Faults

Download Full-text

Static Test Compaction for Scan Circuits by Using Restoration to Modify and Remove Tests

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/tcad.2014.2358932 ◽

2014 ◽

Vol 33 (12) ◽

pp. 1955-1964 ◽

Cited By ~ 5

Author(s):

Irith Pomeranz

Keyword(s):

Static Test ◽

Test Compaction ◽

Scan Circuits

Download Full-text

Static test compaction for IDDQ testing of sequential circuits

10.1109/iddq.1998.730725 ◽

2002 ◽

Cited By ~ 2

Author(s):

Y. Higami ◽

K.K. Saluja ◽

K. Kinoshita

Keyword(s):

Sequential Circuits ◽

Iddq Testing ◽

Static Test ◽

Test Compaction

Download Full-text

Static test compaction for delay fault test sets consisting of broadside and skewed-load tests

29th VLSI Test Symposium ◽

10.1109/vts.2011.5783760 ◽

2011 ◽

Cited By ~ 23

Author(s):

Irith Pomeranz

Keyword(s):

Delay Fault ◽

Static Test ◽

Test Compaction ◽

Load Tests ◽

Test Sets

Download Full-text