This paper presents an efficient method to determine minimum system-on-chip (SOC) test schedules with precedence and power constraints based on simulated annealing. The problem is solved using a partitioned testing scheme with run to completion that minimizes the number of idle test slots. The method can handle SOC test scheduling with and without power constraints in addition to precedence constraints that preserve desirable orderings among tests. We present experimental results for various SOC examples that demonstrate the effectiveness of the method. The method achieved optimal test schedules in all attempted cases in a short CPU time.
An Improved SoC Test Scheduling Method Based on Simulated Annealing Algorithm