Modeling gate and substrate currents due to conduction- and valence-band electron and hole tunneling [CMOS technology]
Excess Low-Frequency Noise in Ultrathin Oxide n-MOSFETs Arising From Valence-Band Electron Tunneling
2005 ◽
Vol 52
(9)
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pp. 2061-2066
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2008 ◽
Vol 77
(10)
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pp. 103301
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1987 ◽
Vol 30
(1-4)
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pp. 298-303
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2007 ◽
Vol 54
(2)
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pp. 316-322
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1993 ◽
Vol 32
(7)
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pp. 645-650
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