Generating Compact Test Patterns for DC and AC Faults Using One ATPG Run

2018 IEEE International Test Conference (ITC) ◽

10.1109/test.2018.8624678 ◽

2018 ◽

Cited By ~ 1

Author(s):

Yi-Cheng Kung ◽

Kuen-Jong Lee ◽

Sudhakar M. Reddy

Keyword(s):

Compact Test

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Compact test generation for bridging faults under I/sub DDQ/ testing

Proceedings 13th IEEE VLSI Test Symposium ◽

10.1109/vtest.1995.512654 ◽

2002 ◽

Cited By ~ 17

Author(s):

R.S. Reddy ◽

I. Pomeranz ◽

S.M. Reddy ◽

S. Kajihara

Keyword(s):

Test Generation ◽

Bridging Faults ◽

Compact Test

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Test point insertion for compact test sets

Proceedings International Test Conference 2000 (IEEE Cat. No.00CH37159) ◽

10.1109/test.2000.894217 ◽

2002 ◽

Cited By ~ 28

Author(s):

M.J. Geuzebroek ◽

J.T. van der Linden ◽

A.J. van de Goor

Keyword(s):

Test Point ◽

Test Point Insertion ◽

Test Sets ◽

Compact Test

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Ping-pong test: Compact test vector generation for reversible circuits

2012 IEEE 30th VLSI Test Symposium (VTS) ◽

10.1109/vts.2012.6231097 ◽

2012 ◽

Cited By ~ 10

Author(s):

Masoud Zamani ◽

Mehdi B. Tahoori ◽

Krishnendu Chakrabarty

Keyword(s):

Test Vector ◽

Reversible Circuits ◽

Vector Generation ◽

Ping Pong ◽

Test Vector Generation ◽

Compact Test

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DLR Compact Test Range facility

2012 6th European Conference on Antennas and Propagation (EUCAP) ◽

10.1109/eucap.2012.6206309 ◽

2012 ◽

Cited By ~ 2

Author(s):

Markus Limbach ◽

B. Gabler ◽

A. Di Maria ◽

R. Horn ◽

A. Reigber

Keyword(s):

Test Range ◽

Compact Test

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Phase and amplitude distribution measurements using a compact test range applicable to wireless cloc

IEEE Antennas and Propagation Society International Symposium (IEEE Cat. No.02CH37313) ◽

10.1109/aps.2002.1018313 ◽

2005 ◽

Author(s):

W. Bornstad ◽

K.K. O

Keyword(s):

Amplitude Distribution ◽

Test Range ◽

Compact Test

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Automatic test generation for analog circuits using compact test transfer function models

Proceedings 10th Asian Test Symposium ◽

10.1109/ats.2001.990317 ◽

2002 ◽

Cited By ~ 2

Author(s):

B. Sahu ◽

A. Chatterjee

Keyword(s):

Transfer Function ◽

Analog Circuits ◽

Test Generation ◽

Automatic Test Generation ◽

Automatic Test ◽

Function Models ◽

Transfer Function Models ◽

Compact Test

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A method to derive compact test sets for path delay faults in combinational circuits

Proceedings of IEEE International Test Conference - (ITC) ◽

10.1109/test.1993.470630 ◽

2002 ◽

Cited By ~ 27

Author(s):

J. Saxena ◽

D.K. Pradhan

Keyword(s):

Delay Faults ◽

Path Delay ◽

Combinational Circuits ◽

Path Delay Faults ◽

Test Sets ◽

Compact Test

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Compact Test Generation With an Influence Input Measure for Launch-On-Capture Transition Fault Testing

IEEE Transactions on Very Large Scale Integration (VLSI) Systems ◽

10.1109/tvlsi.2013.2280170 ◽

2014 ◽

Vol 22 (9) ◽

pp. 1968-1979 ◽

Cited By ~ 6

Author(s):

Dong Xiang ◽

Wenjie Sui ◽

Boxue Yin ◽

Kwang-Ting Cheng

Keyword(s):

Test Generation ◽

Fault Testing ◽

Transition Fault ◽

Compact Test

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Optimization of the Electrical Potential Technique for Crack Growth Monitoring in Compact Test Pieces Using Finite Element Analysis

Journal of Testing and Evaluation ◽

10.1520/jte11382j ◽

1979 ◽

Vol 7 (4) ◽

pp. 208 ◽

Cited By ~ 53

Author(s):

RT Horstman ◽

KC Lieb ◽

BM Power ◽

RL Meltzer ◽

MB Vieth ◽

...

Keyword(s):

Finite Element Analysis ◽

Finite Element ◽

Crack Growth ◽

Electrical Potential ◽

Growth Monitoring ◽

Element Analysis ◽

Test Pieces ◽

Compact Test

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FreezeFrame: compact test generation using a frozen clock strategy

Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings (Cat. No. PR00078) ◽

10.1109/date.1999.761214 ◽

2003 ◽

Cited By ~ 2

Author(s):

Y. Santoso ◽

M. Merten ◽

E.M. Rudnick ◽

M. Abramovici

Keyword(s):

Test Generation ◽

Compact Test

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