Automated system level functional test program generation on ATE from EDA using Functional Test Abstraction

2012 IEEE International Test Conference ◽

10.1109/test.2012.6401590 ◽

2012 ◽

Author(s):

Motoo Ueda ◽

Shinichi Ishikawa ◽

Masaru Goishi ◽

Satoru Kitagawa ◽

Hiroshi Araki ◽

...

Keyword(s):

Functional Test ◽

Automated System ◽

System Level ◽

Test Program ◽

Program Generation

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Automatic functional test program generation for microprocessor verification

Proceedings of the ASP-DAC 2005. Asia and South Pacific Design Automation Conference, 2005. ◽

10.1109/aspdac.2005.1466518 ◽

2005 ◽

Cited By ~ 2

Author(s):

Tun Li ◽

Dan Zhu ◽

Lei Liang ◽

Yang Guo ◽

SiKun Li

Keyword(s):

Functional Test ◽

Test Program ◽

Program Generation ◽

Microprocessor Verification

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Automatic functional test program generation for microprocessor verification

Proceedings of the 2005 conference on Asia South Pacific design automation - ASP-DAC '05 ◽

10.1145/1120725.1120819 ◽

2005 ◽

Author(s):

Tun Li ◽

Dan Zhu ◽

Lei Liang ◽

Yang Guo ◽

SiKun Li

Keyword(s):

Functional Test ◽

Test Program ◽

Program Generation ◽

Microprocessor Verification

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Functional test program generation through interactive graphics

International Test Conference 1988 Proceeding@m_New Frontiers in Testing ◽

10.1109/test.1988.207836 ◽

2003 ◽

Cited By ~ 3

Author(s):

C. Tinaztepe ◽

B. Ozguc

Keyword(s):

Functional Test ◽

Interactive Graphics ◽

Test Program ◽

Program Generation

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Automatic functional test program generation for microprocessors

25th ACM/IEEE, Design Automation Conference.Proceedings 1988. ◽

10.1109/dac.1988.14825 ◽

2003 ◽

Cited By ~ 3

Author(s):

C.-S. Lin ◽

H.-F. Ho

Keyword(s):

Functional Test ◽

Test Program ◽

Program Generation

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Expert system for the functional test program generation of digital electronic circuit boards

International Test Conference 1988 Proceeding@m_New Frontiers in Testing ◽

10.1109/test.1988.207805 ◽

2003 ◽

Cited By ~ 17

Author(s):

S.M. Lea ◽

N. Brown ◽

T. Katz ◽

P. Collins

Keyword(s):

Expert System ◽

Electronic Circuit ◽

Functional Test ◽

Circuit Boards ◽

Test Program ◽

Program Generation

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A new functional test program generation methodology

Proceedings 2001 IEEE International Conference on Computer Design: VLSI in Computers and Processors. ICCD 2001 ◽

10.1109/iccd.2001.955006 ◽

2002 ◽

Cited By ~ 2

Author(s):

F. Fallah ◽

K. Takayama

Keyword(s):

Functional Test ◽

Test Program ◽

Program Generation

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Graph-based functional test program generation for pipelined processors

Proceedings Design, Automation and Test in Europe Conference and Exhibition ◽

10.1109/date.2004.1268846 ◽

2004 ◽

Cited By ~ 27

Author(s):

P. Mishra ◽

N. Dutt

Keyword(s):

Functional Test ◽

Test Program ◽

Program Generation ◽

Pipelined Processors

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Automatic functional test program generation for pipelined processors using model checking

Seventh IEEE International High-Level Design Validation and Test Workshop, 2002. ◽

10.1109/hldvt.2002.1224436 ◽

2003 ◽

Cited By ~ 11

Author(s):

P. Mishra ◽

N. Dutt

Keyword(s):

Model Checking ◽

Functional Test ◽

Test Program ◽

Program Generation ◽

Pipelined Processors

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A kernel-based approach for functional test program generation

2010 IEEE International Test Conference ◽

10.1109/test.2010.5699216 ◽

2010 ◽

Cited By ~ 3

Author(s):

Po-Hsien Chang ◽

Li-C. Wang ◽

Jayanta Bhadra

Keyword(s):

Functional Test ◽

Test Program ◽

Program Generation

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On automatic software-based self-test program generation based on high-level decision diagrams

2016 17th Latin-American Test Symposium (LATS) ◽

10.1109/latw.2016.7483357 ◽

2016 ◽

Cited By ~ 3

Author(s):

Artjom Jasnetski ◽

Raimund Ubar ◽

Anton Tsertov

Keyword(s):

Decision Diagrams ◽

Test Program ◽

Program Generation ◽

Automatic Software ◽

Self Test ◽

High Level

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