Interconnect test pattern generation algorithm for meeting device and global SSO limits with safe initial vectors

Author(s):  
K. Baker ◽  
M. Nourani
2011 ◽  
Vol 1 (2) ◽  
Author(s):  
Mousumi Saha ◽  
Naveen Singh Bisht ◽  
Shrinivas Yadav ◽  
Praveen Kumar K

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