A test-pattern-generation algorithm for sequential circuits

E. Auth; M.H. Schulz

doi:10.1109/54.82040

A test-pattern-generation algorithm for sequential circuits

IEEE Design & Test of Computers ◽

10.1109/54.82040 ◽

1991 ◽

Vol 8 (2) ◽

pp. 72-85 ◽

Cited By ~ 29

Author(s):

E. Auth ◽

M.H. Schulz

Keyword(s):

Test Pattern ◽

Sequential Circuits ◽

Pattern Generation ◽

Test Pattern Generation ◽

Generation Algorithm

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ESSENTIAL: an efficient self-learning test pattern generation algorithm for sequential circuits

10.1109/test.1989.82274 ◽

2003 ◽

Cited By ~ 46

Author(s):

M.H. Schulz ◽

E. Auth

Keyword(s):

Test Pattern ◽

Sequential Circuits ◽

Pattern Generation ◽

Test Pattern Generation ◽

Generation Algorithm ◽

Learning Test ◽

Self Learning

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Analysis of optimization algorithms in automated test pattern generation for sequential circuits

2017 IEEE International Conference on Systems, Man, and Cybernetics (SMC) ◽

10.1109/smc.2017.8122883 ◽

2017 ◽

Cited By ~ 1

Author(s):

Majed M. Alateeq ◽

Witold Pedrycz

Keyword(s):

Test Pattern ◽

Optimization Algorithms ◽

Sequential Circuits ◽

Pattern Generation ◽

Test Pattern Generation ◽

Automated Test

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A comparative analysis of bio-inspired optimization algorithms for automated test pattern generation in sequential circuits

Applied Soft Computing ◽

10.1016/j.asoc.2020.106967 ◽

2021 ◽

Vol 101 ◽

pp. 106967

Author(s):

Majed Alateeq ◽

Witold Pedrycz

Keyword(s):

Comparative Analysis ◽

Test Pattern ◽

Optimization Algorithms ◽

Sequential Circuits ◽

Pattern Generation ◽

Test Pattern Generation ◽

Automated Test

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Improved test pattern generation for sequential circuits using implicit enumeration

[Proceedings] 1992 IEEE International Symposium on Circuits and Systems ◽

10.1109/iscas.1992.230326 ◽

2003 ◽

Author(s):

E. Auth ◽

J. Kastner

Keyword(s):

Test Pattern ◽

Sequential Circuits ◽

Pattern Generation ◽

Test Pattern Generation ◽

Implicit Enumeration

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Automatic test pattern generation for sequential circuits using genetic algorithms

Proceedings Eleventh International Conference on VLSI Design ◽

10.1109/icvd.1998.646616 ◽

2002 ◽

Cited By ~ 1

Author(s):

V. Rajesh ◽

A. Jain

Keyword(s):

Genetic Algorithms ◽

Test Pattern ◽

Sequential Circuits ◽

Pattern Generation ◽

Test Pattern Generation ◽

Automatic Test Pattern Generation ◽

Automatic Test

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A test pattern generation algorithm exploiting behavioral information

Proceedings Seventh Asian Test Symposium (ATS'98) (Cat. No.98TB100259) ◽

10.1109/ats.1998.741660 ◽

2002 ◽

Cited By ~ 2

Author(s):

S. Chiusano ◽

F. Corno ◽

P. Prinetto

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Generation Algorithm ◽

Behavioral Information

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A diagnostic test pattern generation algorithm

Proceedings. International Test Conference 1990 ◽

10.1109/test.1990.114000 ◽

2002 ◽

Cited By ~ 72

Author(s):

P. Camurati ◽

D. Medina ◽

P. Prinetto ◽

M. Sonza Reorda

Keyword(s):

Diagnostic Test ◽

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Generation Algorithm

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Combinational automatic test pattern generation for acyclic sequential circuits

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/tcad.2005.847894 ◽

2005 ◽

Vol 24 (6) ◽

pp. 948-956 ◽

Cited By ~ 3

Author(s):

Yong Chang Kim ◽

V.D. Agrawal ◽

K.K. Saluja

Keyword(s):

Test Pattern ◽

Sequential Circuits ◽

Pattern Generation ◽

Test Pattern Generation ◽

Automatic Test Pattern Generation ◽

Automatic Test

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GATTO: a genetic algorithm for automatic test pattern generation for large synchronous sequential circuits

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/43.511578 ◽

1996 ◽

Vol 15 (8) ◽

pp. 991-1000 ◽

Cited By ~ 74

Author(s):

F. Corno ◽

P. Prinetto ◽

M. Rebaudengo ◽

M. Sonza Reorda

Keyword(s):

Genetic Algorithm ◽

Test Pattern ◽

Sequential Circuits ◽

Pattern Generation ◽

Test Pattern Generation ◽

Automatic Test Pattern Generation ◽

Automatic Test ◽

Synchronous Sequential Circuits

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Design and implementation of a parallel automatic test pattern generation algorithm with low test vector count

Proceedings International Test Conference 2000 (IEEE Cat. No.00CH37159) ◽

10.1109/test.2000.894246 ◽

2002 ◽

Cited By ~ 9

Author(s):

R. Butler ◽

B. Keller ◽

S. Paliwal ◽

R. Schoonover ◽

J. Swenton

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Automatic Test Pattern Generation ◽

Test Vector ◽

Automatic Test ◽

Generation Algorithm ◽

Design And Implementation

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