A Research on IDDT Test Pattern Generation Algorithm Based on Digragh Model

2007 International Conference on Communications, Circuits and Systems ◽

10.1109/icccas.2007.4348259 ◽

2007 ◽

Author(s):

Jiang Shuyan ◽

Chen Guangju ◽

Xie Xuan

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Generation Algorithm

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A test pattern generation algorithm exploiting behavioral information

Proceedings Seventh Asian Test Symposium (ATS'98) (Cat. No.98TB100259) ◽

10.1109/ats.1998.741660 ◽

2002 ◽

Cited By ~ 2

Author(s):

S. Chiusano ◽

F. Corno ◽

P. Prinetto

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Generation Algorithm ◽

Behavioral Information

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A diagnostic test pattern generation algorithm

Proceedings. International Test Conference 1990 ◽

10.1109/test.1990.114000 ◽

2002 ◽

Cited By ~ 72

Author(s):

P. Camurati ◽

D. Medina ◽

P. Prinetto ◽

M. Sonza Reorda

Keyword(s):

Diagnostic Test ◽

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Generation Algorithm

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A test-pattern-generation algorithm for sequential circuits

IEEE Design & Test of Computers ◽

10.1109/54.82040 ◽

1991 ◽

Vol 8 (2) ◽

pp. 72-85 ◽

Cited By ~ 29

Author(s):

E. Auth ◽

M.H. Schulz

Keyword(s):

Test Pattern ◽

Sequential Circuits ◽

Pattern Generation ◽

Test Pattern Generation ◽

Generation Algorithm

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Design and implementation of a parallel automatic test pattern generation algorithm with low test vector count

Proceedings International Test Conference 2000 (IEEE Cat. No.00CH37159) ◽

10.1109/test.2000.894246 ◽

2002 ◽

Cited By ~ 9

Author(s):

R. Butler ◽

B. Keller ◽

S. Paliwal ◽

R. Schoonover ◽

J. Swenton

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Automatic Test Pattern Generation ◽

Test Vector ◽

Automatic Test ◽

Generation Algorithm ◽

Design And Implementation

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A new switch-level test pattern generation algorithm based on single path over a graph representation

Proceedings of the European Design Automation Conference, 1990., EDAC. ◽

10.1109/edac.1990.136681 ◽

2002 ◽

Author(s):

C. Ferrer ◽

J. Oliver ◽

E. Valderrama

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Graph Representation ◽

Test Pattern Generation ◽

Generation Algorithm ◽

Single Path

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Interconnect test pattern generation algorithm for meeting device and global SSO limits with safe initial vectors

2004 International Conferce on Test ◽

10.1109/test.2004.1386949 ◽

2005 ◽

Cited By ~ 2

Author(s):

K. Baker ◽

M. Nourani

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Generation Algorithm ◽

Interconnect Test

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New probabilistic measures for accelerating the automatic test pattern generation algorithm

AUTOTESTCON 93 ◽

10.1109/autest.1993.396314 ◽

2002 ◽

Author(s):

B. Phillips ◽

S. Ganesan ◽

C. Bacon

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Automatic Test Pattern Generation ◽

Automatic Test ◽

Generation Algorithm ◽

Probabilistic Measures

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ESSENTIAL: an efficient self-learning test pattern generation algorithm for sequential circuits

10.1109/test.1989.82274 ◽

2003 ◽

Cited By ~ 46

Author(s):

M.H. Schulz ◽

E. Auth

Keyword(s):

Test Pattern ◽

Sequential Circuits ◽

Pattern Generation ◽

Test Pattern Generation ◽

Generation Algorithm ◽

Learning Test ◽

Self Learning

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Test Pattern Generation Algorithm Using Structurally Synthesized BDD

GSTF Journal on Computing (JoC) ◽

10.5176/2010-2283_1.2.31 ◽

2011 ◽

Vol 1 (2) ◽

Author(s):

Mousumi Saha ◽

Naveen Singh Bisht ◽

Shrinivas Yadav ◽

Praveen Kumar K

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Generation Algorithm

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Concurrent automatic test pattern generation algorithm for combinational circuits

Proceedings of ICCD '95 International Conference on Computer Design. VLSI in Computers and Processors ◽

10.1109/iccd.1995.528823 ◽

2002 ◽

Author(s):

A.F. Yousif ◽

Jun Gu

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Automatic Test Pattern Generation ◽

Combinational Circuits ◽

Automatic Test ◽

Generation Algorithm

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