A diagnostic test pattern generation algorithm

Proceedings. International Test Conference 1990 ◽

10.1109/test.1990.114000 ◽

2002 ◽

Cited By ~ 72

Author(s):

P. Camurati ◽

D. Medina ◽

P. Prinetto ◽

M. Sonza Reorda

Keyword(s):

Diagnostic Test ◽

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Generation Algorithm

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An Efficient Diagnostic Test Pattern Generation Framework Using Boolean Satisfiability

16th Asian Test Symposium (ATS 2007) ◽

10.1109/ats.2007.80 ◽

2007 ◽

Cited By ~ 21

Author(s):

Feijun Zheng ◽

Kwang-Ting Cheng ◽

Xiaolang Yan ◽

John Moondanos ◽

Ziyad Hanna

Keyword(s):

Diagnostic Test ◽

Test Pattern ◽

Boolean Satisfiability ◽

Pattern Generation ◽

Test Pattern Generation

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A test pattern generation algorithm exploiting behavioral information

Proceedings Seventh Asian Test Symposium (ATS'98) (Cat. No.98TB100259) ◽

10.1109/ats.1998.741660 ◽

2002 ◽

Cited By ~ 2

Author(s):

S. Chiusano ◽

F. Corno ◽

P. Prinetto

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Generation Algorithm ◽

Behavioral Information

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Multiple-fault diagnosis based on adaptive diagnostic test pattern generation

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/tcad.2007.8361586 ◽

2007 ◽

Vol 26 (5) ◽

pp. 932-942

Author(s):

Yung-Chieh Lin ◽

Feng Lu ◽

Kwang-Ting Cheng

Keyword(s):

Fault Diagnosis ◽

Diagnostic Test ◽

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Multiple Fault ◽

Multiple Fault Diagnosis

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A test-pattern-generation algorithm for sequential circuits

IEEE Design & Test of Computers ◽

10.1109/54.82040 ◽

1991 ◽

Vol 8 (2) ◽

pp. 72-85 ◽

Cited By ~ 29

Author(s):

E. Auth ◽

M.H. Schulz

Keyword(s):

Test Pattern ◽

Sequential Circuits ◽

Pattern Generation ◽

Test Pattern Generation ◽

Generation Algorithm

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GA based diagnostic test pattern generation for transition faults

2015 19th International Symposium on VLSI Design and Test ◽

10.1109/isvdat.2015.7208122 ◽

2015 ◽

Cited By ~ 2

Author(s):

Anupam Bhar ◽

Santanu Chattopadhyay ◽

Indranil Sengupta ◽

Rohit Kapur

Keyword(s):

Diagnostic Test ◽

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Transition Faults

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Design and implementation of a parallel automatic test pattern generation algorithm with low test vector count

Proceedings International Test Conference 2000 (IEEE Cat. No.00CH37159) ◽

10.1109/test.2000.894246 ◽

2002 ◽

Cited By ~ 9

Author(s):

R. Butler ◽

B. Keller ◽

S. Paliwal ◽

R. Schoonover ◽

J. Swenton

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Automatic Test Pattern Generation ◽

Test Vector ◽

Automatic Test ◽

Generation Algorithm ◽

Design And Implementation

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A new switch-level test pattern generation algorithm based on single path over a graph representation

Proceedings of the European Design Automation Conference, 1990., EDAC. ◽

10.1109/edac.1990.136681 ◽

2002 ◽

Author(s):

C. Ferrer ◽

J. Oliver ◽

E. Valderrama

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Graph Representation ◽

Test Pattern Generation ◽

Generation Algorithm ◽

Single Path

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Dynamic fault collapsing and diagnostic test pattern generation for sequential circuits

1998 IEEE/ACM International Conference on Computer-Aided Design. Digest of Technical Papers (IEEE Cat. No.98CB36287) ◽

10.1109/iccad.1998.742865 ◽

2002 ◽

Cited By ~ 1

Author(s):

V. Boppana ◽

I.K. Fuchs

Keyword(s):

Diagnostic Test ◽

Test Pattern ◽

Sequential Circuits ◽

Pattern Generation ◽

Test Pattern Generation

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Interconnect test pattern generation algorithm for meeting device and global SSO limits with safe initial vectors

2004 International Conferce on Test ◽

10.1109/test.2004.1386949 ◽

2005 ◽

Cited By ~ 2

Author(s):

K. Baker ◽

M. Nourani

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Generation Algorithm ◽

Interconnect Test

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New probabilistic measures for accelerating the automatic test pattern generation algorithm

AUTOTESTCON 93 ◽

10.1109/autest.1993.396314 ◽

2002 ◽

Author(s):

B. Phillips ◽

S. Ganesan ◽

C. Bacon

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Automatic Test Pattern Generation ◽

Automatic Test ◽

Generation Algorithm ◽

Probabilistic Measures

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