Microscopic Hot-Carrier Degradation Modeling of SiGe HBTs Under Stress Conditions Close to the SOA Limit

2017 ◽  
Vol 64 (3) ◽  
pp. 923-929 ◽  
Author(s):  
Hamed Kamrani ◽  
Dominic Jabs ◽  
Vincenzo d'Alessandro ◽  
Niccolo Rinaldi ◽  
Thomas Jacquet ◽  
...  
2017 ◽  
Vol 38 (2) ◽  
pp. 160-163 ◽  
Author(s):  
Prateek Sharma ◽  
Stanislav Tyaginov ◽  
Stewart E. Rauch ◽  
Jacopo Franco ◽  
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2015 ◽  
Vol 55 (9-10) ◽  
pp. 1427-1432 ◽  
Author(s):  
P. Sharma ◽  
S. Tyaginov ◽  
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F. Rudolf ◽  
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