Microscopic Hot-Carrier Degradation Modeling of SiGe HBTs Under Stress Conditions Close to the SOA Limit
2017 ◽
Vol 64
(3)
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pp. 923-929
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2017 ◽
Vol 38
(2)
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pp. 160-163
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2014 ◽
pp. 57-103
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Keyword(s):
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2015 ◽
Vol 55
(9-10)
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pp. 1427-1432
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Keyword(s):
2010 ◽
Vol 54
(12)
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pp. 1598-1601
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