Hot-Carrier Degradation Modeling of Decananometer nMOSFETs Using the Drift-Diffusion Approach

2017 ◽  
Vol 38 (2) ◽  
pp. 160-163 ◽  
Author(s):  
Prateek Sharma ◽  
Stanislav Tyaginov ◽  
Stewart E. Rauch ◽  
Jacopo Franco ◽  
Alexander Makarov ◽  
...  
Keyword(s):  
Drift Diffusion ◽  
Hot Carrier ◽  
Degradation Modeling ◽  
Hot Carrier Degradation

On the limits of applicability of drift-diffusion based hot carrier degradation modeling

2016 ◽  
Vol 55 (4S) ◽  
pp. 04ED14 ◽  
Author(s):  
Markus Jech ◽  
Prateek Sharma ◽  
Stanislav Tyaginov ◽  
Florian Rudolf ◽  
Tibor Grasser
Keyword(s):  
Drift Diffusion ◽  
Hot Carrier ◽  
Degradation Modeling ◽  
Hot Carrier Degradation

Comparison of analytic distribution function models for hot-carrier degradation modeling in nLDMOSFETs

2015 ◽  
Vol 55 (9-10) ◽  
pp. 1427-1432 ◽  
Author(s):  
P. Sharma ◽  
S. Tyaginov ◽  
Y. Wimmer ◽  
F. Rudolf ◽  
K. Rupp ◽  
...  
Keyword(s):  
Distribution Function ◽  
Hot Carrier ◽  
Degradation Modeling ◽  
Function Models ◽  
Hot Carrier Degradation

Hot carrier degradation modeling of short-channel n-FinFETs

2015 ◽  
Author(s):  
I. Messaris ◽  
N. Fasarakis ◽  
T. A. Karatsori ◽  
A. Tsormpatzoglou ◽  
G. Ghibaudo ◽  
...  
Keyword(s):  
Short Channel ◽  
Hot Carrier ◽  
Degradation Modeling ◽  
Hot Carrier Degradation

Microscopic Hot-Carrier Degradation Modeling of SiGe HBTs Under Stress Conditions Close to the SOA Limit

2017 ◽  
Vol 64 (3) ◽  
pp. 923-929 ◽  
Author(s):  
Hamed Kamrani ◽  
Dominic Jabs ◽  
Vincenzo d'Alessandro ◽  
Niccolo Rinaldi ◽  
Thomas Jacquet ◽  
...  
Keyword(s):  
Stress Conditions ◽  
Hot Carrier ◽  
Degradation Modeling ◽  
Hot Carrier Degradation
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