Threshold Voltage Shift Due to Charge Trapping in Dielectric-Gated AlGaN/GaN High Electron Mobility Transistors Examined in Au-Free Technology
2013 ◽
Vol 60
(10)
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pp. 3197-3203
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2020 ◽
Vol 20
(7)
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pp. 4450-4453
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2013 ◽
Vol 52
(8S)
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pp. 08JN08
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2011 ◽
Vol 50
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pp. 110202
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1996 ◽
Vol 43
(4)
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pp. 527-534
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