Threshold voltage uniformity and characterization of microwave performance for GaAs/AlGaAs high electron-mobility transistors grown on Si substrates

T. Aigo; M. Goto; Y. Ohta; A. Jono; A. Tachikawa; A. Moritani

doi:10.1109/16.485533

Threshold voltage uniformity and characterization of microwave performance for GaAs/AlGaAs high electron-mobility transistors grown on Si substrates

IEEE Transactions on Electron Devices ◽

10.1109/16.485533 ◽

1996 ◽

Vol 43 (4) ◽

pp. 527-534 ◽

Cited By ~ 5

Author(s):

T. Aigo ◽

M. Goto ◽

Y. Ohta ◽

A. Jono ◽

A. Tachikawa ◽

...

Keyword(s):

Threshold Voltage ◽

Electron Mobility ◽

High Electron Mobility Transistors ◽

High Electron ◽

High Electron Mobility ◽

Si Substrates ◽

Electron Mobility Transistors

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Growth and characterization of GaN/AlGaN high-electron mobility transistors grown on p-type Si substrates

Physica E Low-dimensional Systems and Nanostructures ◽

10.1016/j.physe.2005.12.115 ◽

2006 ◽

Vol 32 (1-2) ◽

pp. 566-568 ◽

Cited By ~ 5

Author(s):

Kun-Ta Wu ◽

P.H. Chang ◽

S.T. Lien ◽

N.C. Chen ◽

Ching-An Chang ◽

...

Keyword(s):

Electron Mobility ◽

High Electron Mobility Transistors ◽

High Electron ◽

High Electron Mobility ◽

Si Substrates ◽

Electron Mobility Transistors ◽

P Type

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Explanation of threshold voltage scaling in enhancement-mode InAlN/AlN–GaN metal oxide semiconductor high electron mobility transistors on Si substrates

Thin Solid Films ◽

10.1016/j.tsf.2012.05.073 ◽

2012 ◽

Vol 520 (19) ◽

pp. 6230-6232 ◽

Cited By ~ 15

Author(s):

A. Alexewicz ◽

C. Ostermaier ◽

C. Henkel ◽

O. Bethge ◽

J.-F. Carlin ◽

...

Keyword(s):

Threshold Voltage ◽

Electron Mobility ◽

High Electron Mobility Transistors ◽

Metal Oxide Semiconductor ◽

Oxide Semiconductor ◽

High Electron ◽

High Electron Mobility ◽

Si Substrates ◽

Enhancement Mode ◽

Electron Mobility Transistors

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Temperature and time dependent threshold voltage characterization of AlGaN/GaN high electron mobility transistors

physica status solidi (c) ◽

10.1002/pssc.201001102 ◽

2011 ◽

Vol 8 (7-8) ◽

pp. 2232-2234 ◽

Cited By ~ 4

Author(s):

Marko J. Tadjer ◽

Sara Martín Horcajo ◽

Travis J. Anderson ◽

Roberto Cuerdo ◽

Karl D. Hobart ◽

...

Keyword(s):

Threshold Voltage ◽

Electron Mobility ◽

High Electron Mobility Transistors ◽

Time Dependent ◽

High Electron ◽

High Electron Mobility ◽

Electron Mobility Transistors

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Molecular beam epitaxy growth and characterization of InGaP/InGaAs pseudomorphic high electron mobility transistors (HEMTs) having a channel layer over critical layer thickness

IEEE Transactions on Electron Devices ◽

10.1109/16.987103 ◽

2002 ◽

Vol 49 (3) ◽

pp. 354-360 ◽

Cited By ~ 7

Author(s):

Seong-June Jo ◽

Jeong Hoon Kim ◽

Jong-In Song

Keyword(s):

Molecular Beam Epitaxy ◽

Electron Mobility ◽

Molecular Beam ◽

High Electron Mobility Transistors ◽

Molecular Beam Epitaxy Growth ◽

High Electron ◽

Critical Layer Thickness ◽

High Electron Mobility ◽

Electron Mobility Transistors

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Characterization of self-heating in GaN high electron mobility transistors using channel resistance measurement

Japanese Journal of Applied Physics ◽

10.7567/1347-4065/ab07a2 ◽

2019 ◽

Vol 58 (SC) ◽

pp. SCCB11 ◽

Cited By ~ 1

Author(s):

Mei Wu ◽

Meng Zhang ◽

Qing Zhu ◽

Ling Yang ◽

Xiaohua Ma ◽

...

Keyword(s):

Electron Mobility ◽

High Electron Mobility Transistors ◽

Resistance Measurement ◽

High Electron ◽

High Electron Mobility ◽

Self Heating ◽

Electron Mobility Transistors ◽

Channel Resistance

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Control of Threshold Voltage in GaN Based Metal–Oxide–Semiconductor High-Electron Mobility Transistors towards the Normally-Off Operation

Japanese Journal of Applied Physics ◽

10.7567/jjap.52.08jn08 ◽

2013 ◽

Vol 52 (8S) ◽

pp. 08JN08 ◽

Cited By ~ 20

Author(s):

Milan Ťapajna ◽

Ján Kuzmík

Keyword(s):

Metal Oxide ◽

Threshold Voltage ◽

Electron Mobility ◽

High Electron Mobility Transistors ◽

Metal Oxide Semiconductor ◽

Oxide Semiconductor ◽

High Electron ◽

High Electron Mobility ◽

Electron Mobility Transistors

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Threshold voltage controlled by gate area and gate recess in inverted trapezoidal trigate AlGaN/GaN MOS high-electron-mobility transistors with photoenhanced chemical and plasma-enhanced atomic layer deposition oxides

Applied Physics Express ◽

10.7567/apex.8.084101 ◽

2015 ◽

Vol 8 (8) ◽

pp. 084101 ◽

Cited By ~ 1

Author(s):

Po-Chun Yeh ◽

Yun-Wei Lin ◽

Yue-Lin Huang ◽

Jui-Hung Hung ◽

Bo-Ren Lin ◽

...

Keyword(s):

Atomic Layer Deposition ◽

Threshold Voltage ◽

Electron Mobility ◽

High Electron Mobility Transistors ◽

Atomic Layer ◽

High Electron ◽

High Electron Mobility ◽

Electron Mobility Transistors ◽

Layer Deposition ◽

Gate Recess

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Threshold Voltage Instability in Al$_{2}$O$_{3}$/GaN/AlGaN/GaN Metal–Insulator–Semiconductor High-Electron Mobility Transistors

Japanese Journal of Applied Physics ◽

10.1143/jjap.50.110202 ◽

2011 ◽

Vol 50 ◽

pp. 110202 ◽

Cited By ~ 25

Author(s):

Sen Huang ◽

Shu Yang ◽

John Roberts ◽

Kevin J. Chen

Keyword(s):

Threshold Voltage ◽

Electron Mobility ◽

High Electron Mobility Transistors ◽

High Electron ◽

Metal Insulator ◽

High Electron Mobility ◽

Metal Insulator Semiconductor ◽

Voltage Instability ◽

Electron Mobility Transistors

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Optical and electrical characterization of AlGaN/GaN high electron mobility transistors irradiated with 5MeV protons

Journal of Crystal Growth ◽

10.1016/j.jcrysgro.2011.01.052 ◽

2011 ◽

Vol 326 (1) ◽

pp. 62-64 ◽

Cited By ~ 14

Author(s):

Hong-Yeol Kim ◽

Travis Anderson ◽

Michael A. Mastro ◽

Jaime A. Freitas ◽

Soohwan Jang ◽

...

Keyword(s):

Electron Mobility ◽

Electrical Characterization ◽

High Electron Mobility Transistors ◽

High Electron ◽

High Electron Mobility ◽

Electron Mobility Transistors

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Effects of process temperature during atomic layer deposition using water and ozone as oxidants on current–voltage characteristics of Al2O3/AlGaN/GaN high-electron-mobility transistors on Si substrates

Japanese Journal of Applied Physics ◽

10.7567/jjap.54.020301 ◽

2015 ◽

Vol 54 (2) ◽

pp. 020301 ◽

Cited By ~ 5

Author(s):

Toshiharu Kubo ◽

Joseph J. Freedsman ◽

Yusuke Yoshida ◽

Takashi Egawa

Keyword(s):

Electron Mobility ◽

High Electron Mobility Transistors ◽

Atomic Layer ◽

High Electron ◽

High Electron Mobility ◽

Si Substrates ◽

Electron Mobility Transistors ◽

Layer Deposition ◽

Current Voltage ◽

Current Voltage Characteristics

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