Two-Stage Degradation of p-Channel Poly-Si Thin-Film Transistors Under Dynamic Negative Bias Temperature Stress

Jie Zhou; Mingxiang Wang; Man Wong

doi:10.1109/ted.2011.2158582

Two-Stage Degradation of p-Channel Poly-Si Thin-Film Transistors Under Dynamic Negative Bias Temperature Stress

IEEE Transactions on Electron Devices ◽

10.1109/ted.2011.2158582 ◽

2011 ◽

Vol 58 (9) ◽

pp. 3034-3041 ◽

Cited By ~ 14

Author(s):

Jie Zhou ◽

Mingxiang Wang ◽

Man Wong

Keyword(s):

Thin Film ◽

Temperature Stress ◽

Thin Film Transistors ◽

Negative Bias ◽

Two Stage ◽

Bias Temperature Stress ◽

Si Thin Film

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Instability of p-channel poly-Si thin-film transistors under dynamic negative bias temperature stress

2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits ◽

10.1109/ipfa.2010.5531996 ◽

2010 ◽

Cited By ~ 4

Author(s):

Jie Zhou ◽

Mingxiang Wang ◽

Man Wong

Keyword(s):

Thin Film ◽

Temperature Stress ◽

Thin Film Transistors ◽

Negative Bias ◽

Bias Temperature Stress ◽

Si Thin Film

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A Two-Stage Degradation Model of p-Channel Low-Temperature Poly-Si Thin-Film Transistors Under Positive Bias Temperature Stress

IEEE Transactions on Electron Devices ◽

10.1109/ted.2011.2160949 ◽

2011 ◽

Vol 58 (10) ◽

pp. 3501-3505 ◽

Cited By ~ 5

Author(s):

Xiaowei Lu ◽

Mingxiang Wang ◽

Man Wong

Keyword(s):

Thin Film ◽

Low Temperature ◽

Temperature Stress ◽

Thin Film Transistors ◽

Positive Bias ◽

Two Stage ◽

Degradation Model ◽

Bias Temperature Stress ◽

Si Thin Film

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ON-Current Stability of Poly-Si Thin Film Transistor with Si-rich Oxide as Intermetal Dielectric Film after Negative Bias Temperature Stress

10.7567/ssdm.1994.ld-18 ◽

1994 ◽

Author(s):

Gug-Seon Choi ◽

Jin-Ho Choi ◽

Yoon-Jong Lee ◽

Jong-Wan Nam ◽

Sook-Rak Ma ◽

...

Keyword(s):

Thin Film ◽

Temperature Stress ◽

Dielectric Film ◽

Thin Film Transistor ◽

Negative Bias ◽

Bias Temperature Stress ◽

Intermetal Dielectric ◽

Si Thin Film

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Investigation of the instability of low-temperature poly-silicon thin film transistors under a negative bias temperature stress

Electronic Materials Letters ◽

10.1007/s13391-013-3173-4 ◽

2013 ◽

Vol 9 (S1) ◽

pp. 13-16 ◽

Cited By ~ 2

Author(s):

Yu-Mi Kim ◽

Kwang-Seok Jeong ◽

Ho-Jin Yun ◽

Seung-Dong Yang ◽

Sang-Youl Lee ◽

...

Keyword(s):

Thin Film ◽

Low Temperature ◽

Temperature Stress ◽

Thin Film Transistors ◽

Negative Bias ◽

Silicon Thin Film ◽

Poly Silicon ◽

Bias Temperature Stress

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Improving Negative-Bias-Temperature-Stress Stability for Thin-Film Transistors by Doping Mg Into ScInO Semiconductor

IEEE Transactions on Electron Devices ◽

10.1109/ted.2019.2911635 ◽

2019 ◽

Vol 66 (6) ◽

pp. 2620-2623 ◽

Cited By ~ 1

Author(s):

Linfeng Lan ◽

Xingqiang Dai ◽

Changchun He ◽

Lu Liu ◽

Xiaobao Yang ◽

...

Keyword(s):

Thin Film ◽

Temperature Stress ◽

Thin Film Transistors ◽

Negative Bias ◽

Bias Temperature Stress

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Investigation of Degradation Behavior During Illuminated Negative Bias Temperature Stress in P-Channel Low-Temperature Polycrystalline Silicon Thin-Film Transistors

IEEE Electron Device Letters ◽

10.1109/led.2021.3068423 ◽

2021 ◽

Vol 42 (5) ◽

pp. 712-715

Author(s):

Yu-Xuan Wang ◽

Ting-Chang Chang ◽

Mao-Chou Tai ◽

Chia-Chuan Wu ◽

Yu-Fa Tu ◽

...

Keyword(s):

Thin Film ◽

Low Temperature ◽

Temperature Stress ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Negative Bias ◽

Degradation Behavior ◽

Silicon Thin Film ◽

Bias Temperature Stress

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Investigation on the change of the performance of Si-Zn-Sn-O thin film transistors under negative bias temperature stress depending on the channel thickness

Solid-State Electronics ◽

10.1016/j.sse.2018.12.021 ◽

2019 ◽

Vol 153 ◽

pp. 93-98 ◽

Cited By ~ 1

Author(s):

Jin Young Hwang ◽

Sang Yeol Lee

Keyword(s):

Thin Film ◽

Temperature Stress ◽

Thin Film Transistors ◽

Negative Bias ◽

Channel Thickness ◽

Bias Temperature Stress

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Positive bias temperature stress induced degradation in p-channel poly-Si thin-film transistors

18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) ◽

10.1109/ipfa.2011.5992774 ◽

2011 ◽

Cited By ~ 2

Author(s):

Xiaowei Lu ◽

Mingxiang Wang ◽

Man Wong

Keyword(s):

Thin Film ◽

Temperature Stress ◽

Thin Film Transistors ◽

Positive Bias ◽

Bias Temperature Stress ◽

Si Thin Film

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Two-Stage Degradation of p-Type Polycrystalline Silicon Thin-Film Transistors Under Dynamic Positive Bias Temperature Stress

IEEE Transactions on Electron Devices ◽

10.1109/ted.2014.2359299 ◽

2014 ◽

Vol 61 (11) ◽

pp. 3751-3756 ◽

Cited By ~ 5

Author(s):

Dongli Zhang ◽

Mingxiang Wang ◽

Xiaowei Lu

Keyword(s):

Thin Film ◽

Temperature Stress ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Positive Bias ◽

Silicon Thin Film ◽

Two Stage ◽

Bias Temperature Stress ◽

P Type

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Influence of Channel Layer Thickness on the Instability of Amorphous SiZnSnO Thin Film Transistors Under Negative Bias Temperature Stress

physica status solidi (a) ◽

10.1002/pssa.201700698 ◽

2018 ◽

Vol 215 (12) ◽

pp. 1700698 ◽

Cited By ~ 8

Author(s):

Byeong Hyeon Lee ◽

Sang Yeol Lee

Keyword(s):

Thin Film ◽

Layer Thickness ◽

Temperature Stress ◽

Thin Film Transistors ◽

Negative Bias ◽

Channel Layer ◽

Bias Temperature Stress

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