Influence of Channel Layer Thickness on the Instability of Amorphous SiZnSnO Thin Film Transistors Under Negative Bias Temperature Stress
2018 ◽
Vol 215
(12)
◽
pp. 1700698
◽
Keyword(s):
2013 ◽
Vol 9
(S1)
◽
pp. 13-16
◽
Keyword(s):
Keyword(s):
2019 ◽
Vol 66
(6)
◽
pp. 2620-2623
◽
Keyword(s):
2011 ◽
Vol 58
(9)
◽
pp. 3034-3041
◽
Keyword(s):
Keyword(s):
2019 ◽
Vol 66
(7)
◽
pp. 2954-2959
Keyword(s):
2011 ◽
Vol 50
(2R)
◽
pp. 024104
◽
Keyword(s):
1994 ◽
Keyword(s):
Keyword(s):