Characterization of Distribution of Trap States in Silicon-on-Insulator Layers by Front-Gate Characteristics in n-Channel SOI MOSFETs
2008 ◽
Vol 55
(7)
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pp. 1702-1707
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2009 ◽
Vol 48
(3)
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pp. 031201
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2003 ◽
Vol 42
(Part 1, No. 4B)
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pp. 2004-2008
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2015 ◽
Vol 5
(4)
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pp. P3069-P3072
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