Formation and nondestructive characterization of ion implanted silicon‐on‐insulator layers

1987 ◽  
Vol 51 (5) ◽  
pp. 343-345 ◽  
Author(s):  
J. Narayan ◽  
S. Y. Kim ◽  
K. Vedam ◽  
R. Manukonda
Keyword(s):  
Silicon On Insulator ◽  
Insulator Layers ◽  
Nondestructive Characterization ◽  
Ion Implanted

Nondestructive characterization of oxygen‐ion‐implanted silicon‐ on‐insulator using multiple‐angle ellipsometry

1988 ◽  
Vol 64 (5) ◽  
pp. 2754-2756 ◽  
Author(s):  
Pradip Dutta ◽  
George A. Candela ◽  
Deane Chandler‐Horowitz ◽  
J. F. Marchiando ◽  
Martin C. Peckerar
Keyword(s):  
Silicon On Insulator ◽  
Oxygen Ion ◽  
Nondestructive Characterization ◽  
Ion Implanted

Characterization of Light Element Impurities in Ultrathin Silicon-on-Insulator Layers by Luminescence Activation Using Electron Irradiation

2009 ◽  
Vol 48 (3) ◽  
pp. 031201 ◽  
Author(s):  
Satoko Nakagawa-Toyota ◽  
Michio Tajima ◽  
Kazuyuki Hirose ◽  
Takeshi Ohshima ◽  
Hisayoshi Itoh
Keyword(s):  
Electron Irradiation ◽  
Light Element ◽  
Silicon On Insulator ◽  
Insulator Layers

Formation And Nondestructive Characterization Of Ion Implanted Soi Layers

1987 ◽  
Author(s):  
J. Narayan ◽  
M. El Ghor ◽  
S. Y. Kim ◽  
K. Vedam ◽  
R. Manukonda ◽  
...  
Keyword(s):  
Nondestructive Characterization ◽  
Ion Implanted

scholarly journals Nondestructive characterization of nitrogen‐implanted silicon‐on‐insulator structures by spectroscopic ellipsometry

1989 ◽  
Vol 66 (10) ◽  
pp. 5052-5057 ◽  
Author(s):  
M. Fried ◽  
T. Lohner ◽  
J. M. M. de Nijs ◽  
A. van Silfhout ◽  
L. J. Hanekamp ◽  
...  
Keyword(s):  
Spectroscopic Ellipsometry ◽  
Silicon On Insulator ◽  
Nondestructive Characterization

Characterization of Distribution of Trap States in Silicon-on-Insulator Layers by Front-Gate Characteristics in n-Channel SOI MOSFETs

2008 ◽  
Vol 55 (7) ◽  
pp. 1702-1707 ◽  
Author(s):  
Kenji Kajiwara ◽  
Yoshikata Nakajima ◽  
Tatsuro Hanajiri ◽  
Toru Toyabe ◽  
Takuo Sugano
Keyword(s):  
Silicon On Insulator ◽  
Trap States ◽  
Insulator Layers ◽  
Characterization Of Distribution

A Possible Basis for Nondestructive Characterization of Ropes of Nylon 6

1997 ◽  
Vol 503 ◽  
Author(s):  
H. Jiang ◽  
M. K. Davis ◽  
R. K. Eby ◽  
P. Arsenovic
Keyword(s):  
Tensile Strength ◽  
Service Life ◽  
Fiber Diameter ◽  
Structural Parameters ◽  
Crystal Form ◽  
Nylon 6 ◽  
Remaining Service Life ◽  
Nondestructive Characterization ◽  
Fractional Content

ABSTRACTPhysical properties and structural parameters have been measured for ropes of nylon 6 as a function of the number of use operations. The fractional content of the α crystal form, sound velocity, birefringence, tensile strength and length all increase systematically and significantly with increasing the number of use operations. The fractional content of the γ crystal form and fiber diameter decrease with use. These trends indicate that the measurement of such properties and structural parameters, especially the length, provide a possible basis for establishing a reliable, rapid, and convenient nondestructive characterization method to predict the remaining service life of nylon 6 ropes.

Sign in / Sign up

Export Citation Format

Share Document