Low-Field Electron Mobility Model for Ultrathin-Body SOI and Double-Gate MOSFETs With Extremely Small Silicon Thicknesses
2007 ◽
Vol 54
(9)
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pp. 2204-2212
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2003 ◽
Vol 50
(12)
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pp. 2445-2455
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Keyword(s):
2015 ◽
Vol 62
(11)
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pp. 3645-3652
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Keyword(s):
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2016 ◽
Vol 27
(11)
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pp. 11353-11357
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Keyword(s):
A new technique to determine the average low-field electron mobility in MESFET using C-V measurement
1992 ◽
Vol 39
(9)
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pp. 1982-1986
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2006 ◽
Vol 53
(12)
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pp. 3054-3062
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Keyword(s):
2017 ◽
Vol 17
(2)
◽
pp. 422-431
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