Measurement of the low‐field electron mobility and compensation ratio profiles in GaAs field‐effect transistors
Keyword(s):
Keyword(s):
Keyword(s):
Keyword(s):
2016 ◽
Vol 49
(25)
◽
pp. 255104
◽
Keyword(s):
2016 ◽
Vol 4
(37)
◽
pp. 8758-8764
◽
Keyword(s):
2016 ◽
Vol 27
(11)
◽
pp. 11353-11357
◽
Keyword(s):