Degradation in (Ba,Sr)TiO/sub 3/ thin films under DC and dynamic stress conditions

Author(s):  
T. Horikawa ◽  
T. Kawahara ◽  
M. Yamamuka ◽  
K. Ono
1993 ◽  
Author(s):  
Irith Gilath ◽  
S. Eliezer ◽  
T. Bar-Noy ◽  
R. Englman ◽  
Z. Jaeger

2019 ◽  
Vol 9 (2) ◽  
pp. 214 ◽  
Author(s):  
Johannes Bott ◽  
Roland Franz

Plastic and rubber based composites containing carbon black (CB) were investigated for the potential to release CB nano-particulates under stress conditions into food simulants. Nanocomposites were exposed to thermal, chemical, and mechanical stress, followed by mechanical abrasion of their surface. Particle sensitive asymmetric flow field-flow fractionation (AF4) with multi angle laser light scattering (MALLS) detection was used to detect and quantify CB nano-particulates. This study demonstrates that, even under dynamic stress conditions, CB nano-particulates are not released from the plastic or rubber compounds into food. This study intends also to propose a general nano-release stress test protocol for plastic materials coming into contact with foodstuff.


2014 ◽  
Vol 2014 (HITEC) ◽  
pp. 000228-000234
Author(s):  
Jack Flicker ◽  
David Hughart ◽  
Robert Kaplar ◽  
Stanley Atcitty ◽  
Matthew Marinella

1200 V Silicon Carbide (SiC) Metal-Oxide-Semiconductor Field Effect Transistors (MOSFETs) and Junction Field Effect Transistors (JFETs) have been characterized at high operational temperatures. For packaged JFETs obtained from a collaborating manufacturer, the threshold shift (ΔVT) was measured under both static and dynamic voltage stress and, in all cases, was less than 2 mV, which is within the measurement margin of error. Temperatures up to 250°C and stress times as long as 200 hours were evaluated. As a comparison, commercially available SiC MOSFETs demonstrated shifts of up to 300 mV after 30 minutes of static gate stress at 175°C. In addition, results from unpackaged JFET die at temperatures up to 525°C show ΔVT values of less than 10 mV for all stress conditions. Although VT remained unchanged for the duration of the test for both static and dynamic stress conditions, under dynamic stress conditions the JFET packaged parts demonstrated a linear increase in sub-threshold leakage current of around 15.6 nA per hour; in contrast, the MOSFET devices showed an exponential increase in sub-threshold leakage under dynamic stress. The increase in sub-threshold leakage current could be recovered temporarily, but long-term behavior was consistent with cumulative damage.


Energy ◽  
2013 ◽  
Vol 59 ◽  
pp. 422-431 ◽  
Author(s):  
S. Genc ◽  
E. Sorguven ◽  
M. Ozilgen ◽  
I. Aksan Kurnaz

2019 ◽  
Vol 9 (2) ◽  
pp. 221 ◽  
Author(s):  
Johannes Bott ◽  
Roland Franz

Three plastic nanocomposites containing the nanomaterials silver, titanium nitride, and laponite were investigated on the potential to release nanoparticulates under stress conditions into food simulants. Nanocomposites were exposed to thermal, chemical, and mechanical stress followed by mechanical abrasion of their surface. Particle sensitive asymmetric flow field-flow fractionation (AF4) with multi-angle laser light scattering (MALLS) as well as inductively coupled plasma mass spectrometry (ICP-MS) detection was used to detect and quantify the respective nanoparticulates. The results of this study demonstrate that even under dynamic stress conditions nanoparticulates are not released from the nanocomposites into food.


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