Fowler-Nordheim and hot-carrier stress study of latent plasma charging damage in various 50 Å gate dielectrics

2002 ◽  
Author(s):  
T. Brozek ◽  
J. Huber ◽  
J. Walls
Keyword(s):  
Gate Dielectrics ◽  
Hot Carrier ◽  
Stress Study ◽  
Hot Carrier Stress

Breakdown mechanisms in ultra-thin oxides: impact of carrier energy and current through substrate hot carrier stress study

2004 ◽  
Vol 72 (1-4) ◽  
pp. 10-15 ◽  
Author(s):  
G Ribes ◽  
S Bruyère ◽  
M Denais ◽  
F Monsieur ◽  
V Huard ◽  
...  
Keyword(s):  
Hot Carrier ◽  
Stress Study ◽  
Hot Carrier Stress ◽  
Carrier Energy

HOT CARRIER STRESS INDUCED CHANGES IN MOST TRANSCONDUCTANCE STRUCTURE

1988 ◽  
Vol 49 (C4) ◽  
pp. C4-779-C4-782 ◽  
Author(s):  
C. BERGONZONI ◽  
R. BENECCHI ◽  
P. CAPRARA
Keyword(s):  
Hot Carrier ◽  
Hot Carrier Stress ◽  
Induced Changes

Degradation induced by TID radiation and hot-carrier stress in 130-nm short channel PDSOI NMOSFETs

2017 ◽  
Vol 74 ◽  
pp. 74-80 ◽  
Author(s):  
Lihua Dai ◽  
Xiaonian Liu ◽  
Mengying Zhang ◽  
Leqing Zhang ◽  
Zhiyuan Hu ◽  
...  
Keyword(s):  
Short Channel ◽  
Hot Carrier ◽  
Hot Carrier Stress
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