Hot-electron-induced degradation of pseudomorphic high-electron mobility transistors

Author(s):  
Y.A. Tkachenko ◽  
C.J. Wei ◽  
J.C.M. Hwang ◽  
T.D. Harris ◽  
R.D. Grober ◽  
...  
2014 ◽  
Vol 61 (8) ◽  
pp. 2793-2801 ◽  
Author(s):  
Milan Tapajna ◽  
Nicole Killat ◽  
Vassil Palankovski ◽  
Dagmar Gregusova ◽  
Karol Cico ◽  
...  

2011 ◽  
Vol 109 (3) ◽  
pp. 034501 ◽  
Author(s):  
Y. S. Puzyrev ◽  
T. Roy ◽  
M. Beck ◽  
B. R. Tuttle ◽  
R. D. Schrimpf ◽  
...  

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