Hot-electron induced defect generation in AlGaN/GaN high electron mobility transistors

2013 ◽  
Vol 79 ◽  
pp. 11-13 ◽  
Author(s):  
Hemant Rao ◽  
Gijs Bosman
Keyword(s):  
Electron Mobility ◽  
High Electron Mobility Transistors ◽  
High Electron ◽  
Hot Electron ◽  
High Electron Mobility ◽  
Defect Generation ◽  
Electron Mobility Transistors

Hot-Electron-Related Degradation in InAlN/GaN High-Electron-Mobility Transistors

2014 ◽  
Vol 61 (8) ◽  
pp. 2793-2801 ◽  
Author(s):  
Milan Tapajna ◽  
Nicole Killat ◽  
Vassil Palankovski ◽  
Dagmar Gregusova ◽  
Karol Cico ◽  
...  
Keyword(s):  
Electron Mobility ◽  
High Electron Mobility Transistors ◽  
High Electron ◽  
Hot Electron ◽  
High Electron Mobility ◽  
Electron Mobility Transistors

Dehydrogenation of defects and hot-electron degradation in GaN high-electron-mobility transistors

2011 ◽  
Vol 109 (3) ◽  
pp. 034501 ◽  
Author(s):  
Y. S. Puzyrev ◽  
T. Roy ◽  
M. Beck ◽  
B. R. Tuttle ◽  
R. D. Schrimpf ◽  
...  
Keyword(s):  
Electron Mobility ◽  
High Electron Mobility Transistors ◽  
High Electron ◽  
Hot Electron ◽  
High Electron Mobility ◽  
Electron Mobility Transistors
Sign in / Sign up

Export Citation Format

Share Document