Stability of Amorphous Indium–Tungsten Oxide Thin-Film Transistors Under Various Wavelength Light Illumination

2016 ◽  
Vol 37 (4) ◽  
pp. 437-440 ◽  
Author(s):  
Zhao Yang ◽  
Ting Meng ◽  
Qun Zhang ◽  
Han-Ping D. Shieh
Keyword(s):  
Thin Film ◽  
Tungsten Oxide ◽  
Thin Film Transistors ◽  
Oxide Thin Film ◽  
Light Illumination ◽  
Wavelength Light

Stability study of indium tungsten oxide thin-film transistors annealed under various ambient conditions

2016 ◽  
Vol 214 (2) ◽  
pp. 1600465 ◽  
Author(s):  
Mingyue Qu ◽  
Chih-Hsiang Chang ◽  
Ting Meng ◽  
Qun Zhang ◽  
Po-Tsun Liu ◽  
...  
Keyword(s):  
Thin Film ◽  
Tungsten Oxide ◽  
Thin Film Transistors ◽  
Stability Study ◽  
Oxide Thin Film ◽  
Ambient Conditions

The Influence of Annealing Temperature on Amorphous Indium-Zinc-Tungsten Oxide Thin-Film Transistors

2018 ◽  
Vol 215 (6) ◽  
pp. 1700785 ◽  
Author(s):  
Ruofan Fu ◽  
Jianwen Yang ◽  
Wei-Chiao Chang ◽  
Wei-Cheng Chang ◽  
Chien-Min Chang ◽  
...  
Keyword(s):  
Thin Film ◽  
Tungsten Oxide ◽  
Thin Film Transistors ◽  
Annealing Temperature ◽  
Oxide Thin Film
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