The Influence of Annealing Temperature on Amorphous Indium-Zinc-Tungsten Oxide Thin-Film Transistors

2018 ◽  
Vol 215 (6) ◽  
pp. 1700785 ◽  
Author(s):  
Ruofan Fu ◽  
Jianwen Yang ◽  
Wei-Chiao Chang ◽  
Wei-Cheng Chang ◽  
Chien-Min Chang ◽  
...  
Keyword(s):  
Thin Film ◽  
Tungsten Oxide ◽  
Thin Film Transistors ◽  
Annealing Temperature ◽  
Oxide Thin Film

Effects of Annealing Temperature on Electrical Characteristics of Solution-Processed Zinc Tin Oxide Thin-Film Transistors

2012 ◽  
Vol 51 (6R) ◽  
pp. 061101 ◽  
Author(s):  
Jeong-Soo Lee ◽  
Yong-Jin Kim ◽  
Yong-Uk Lee ◽  
Yong-Hoon Kim ◽  
Jang-Yeon Kwon ◽  
...  
Keyword(s):  
Thin Film ◽  
Tin Oxide ◽  
Thin Film Transistors ◽  
Annealing Temperature ◽  
Oxide Thin Film ◽  
Electrical Characteristics ◽  
Solution Processed ◽  
Zinc Tin Oxide

P-28: Effect of Annealing Temperature on Reliability of Solution-Processed Zinc Tin Oxide Thin Film Transistors

2010 ◽  
Vol 41 (1) ◽  
pp. 1325
Author(s):  
Jeong-Soo Lee ◽  
Yong-Jin Kim ◽  
Yong-Uk Lee ◽  
Seung-Hee Kuk ◽  
Min-Koo Han ◽  
...  
Keyword(s):  
Thin Film ◽  
Tin Oxide ◽  
Thin Film Transistors ◽  
Annealing Temperature ◽  
Oxide Thin Film ◽  
Solution Processed ◽  
Zinc Tin Oxide

Stability study of indium tungsten oxide thin-film transistors annealed under various ambient conditions

2016 ◽  
Vol 214 (2) ◽  
pp. 1600465 ◽  
Author(s):  
Mingyue Qu ◽  
Chih-Hsiang Chang ◽  
Ting Meng ◽  
Qun Zhang ◽  
Po-Tsun Liu ◽  
...  
Keyword(s):  
Thin Film ◽  
Tungsten Oxide ◽  
Thin Film Transistors ◽  
Stability Study ◽  
Oxide Thin Film ◽  
Ambient Conditions
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