2018 IEEE 2nd Electron Devices Technology and Manufacturing Conference (EDTM)
Latest Publications

TOTAL DOCUMENTS

116

(FIVE YEARS 0)

H-INDEX

(FIVE YEARS 0)

Published By IEEE

9781538637128

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Particle removal characteristics in liquid flow during wafer rotation

2018 IEEE 2nd Electron Devices Technology and Manufacturing Conference (EDTM) ◽

10.1109/edtm.2018.8421465 ◽

2018 ◽

Author(s):

Naoyuki Handa ◽

Satomi Hamada ◽

Masayoshi Imai ◽

Yutaka Wada ◽

Hiroshi Sobukawa ◽

...

Keyword(s):

Liquid Flow ◽

Particle Removal

Download Full-text

Device Design Parameter for Desired DC Gain and Hysteresis-Free FDSOI NCFETs

2018 IEEE 2nd Electron Devices Technology and Manufacturing Conference (EDTM) ◽

10.1109/edtm.2018.8421484 ◽

2018 ◽

Author(s):

Shruti Mehrotra ◽

S. Qureshi

Keyword(s):

Design Parameter ◽

Device Design ◽

Dc Gain

Download Full-text

Energy and Area Efficient Tunnel FET-based Spiking Neural Networks

2018 IEEE 2nd Electron Devices Technology and Manufacturing Conference (EDTM) ◽

10.1109/edtm.2018.8421527 ◽

2018 ◽

Cited By ~ 1

Author(s):

Dinesh Rajasekharan ◽

Sarvesh S. Chauhan ◽

Amit Ranjan Trivedi ◽

Yogesh Singh Chauhan

Keyword(s):

Neural Networks ◽

Spiking Neural Networks ◽

Tunnel Fet ◽

Area Efficient

Download Full-text

Quadrupole-electrode-integrated micropores for selective single-particle detections

2018 IEEE 2nd Electron Devices Technology and Manufacturing Conference (EDTM) ◽

10.1109/edtm.2018.8421447 ◽

2018 ◽

Author(s):

Tomoki Hayashida ◽

Takahito Ohshiro ◽

Makusu Tsutsui ◽

Masateru Taniguchi

Keyword(s):

Single Particle

Download Full-text

Ultra-high-efficient Writing in Voltage-Control Spintronics Memory(VoCSM); the Most Promising Embedded Memory for Deep Learning

2018 IEEE 2nd Electron Devices Technology and Manufacturing Conference (EDTM) ◽

10.1109/edtm.2018.8421494 ◽

2018 ◽

Cited By ~ 1

Author(s):

Y. Ohsawa ◽

H. Yoda ◽

N. Shimomura ◽

S. Shirotori ◽

S. Fujita ◽

...

Keyword(s):

Deep Learning ◽

Voltage Control ◽

Embedded Memory ◽

High Efficient

Download Full-text

Radio-frequency Superiority of Poly-Si TFTs with T-Shaped Gate and Air Spacers for IoT Applications

2018 IEEE 2nd Electron Devices Technology and Manufacturing Conference (EDTM) ◽

10.1109/edtm.2018.8421455 ◽

2018 ◽

Cited By ~ 1

Author(s):

Z. Y. Yang ◽

Y.A. Huang ◽

H. C. Lin ◽

P. W. Li ◽

K. M. Chen ◽

...

Keyword(s):

Radio Frequency ◽

Iot Applications

Download Full-text

Atomic Layer Etching: Benefits and Challenges

2018 IEEE 2nd Electron Devices Technology and Manufacturing Conference (EDTM) ◽

10.1109/edtm.2018.8421486 ◽

2018 ◽

Cited By ~ 1

Author(s):

Thorsten Lill ◽

Keren J. Kanarik ◽

Samantha Tan ◽

Skip Berry ◽

Andreas Fischer ◽

...

Keyword(s):

Atomic Layer ◽

Atomic Layer Etching

Download Full-text

Soft Error Rate from Planar to FinFETs On Bulk Vs SOI Processes

2018 IEEE 2nd Electron Devices Technology and Manufacturing Conference (EDTM) ◽

10.1109/edtm.2018.8421487 ◽

2018 ◽

Cited By ~ 1

Author(s):

Krishna Mohan Chavali ◽

Mahadeva Iyer Natarajan

Keyword(s):

Error Rate ◽

Soft Error ◽

Soft Error Rate

Download Full-text

Short Flow Characterization Vehicle (Test Chip) Usage in Advanced Technology Development and Yield Improvement

2018 IEEE 2nd Electron Devices Technology and Manufacturing Conference (EDTM) ◽

10.1109/edtm.2018.8421446 ◽

2018 ◽

Cited By ~ 2

Author(s):

Tomasz Brozek

Keyword(s):

Technology Development ◽

Advanced Technology ◽

Test Chip ◽

Yield Improvement ◽

Flow Characterization ◽

Vehicle Test

Download Full-text

Introduction of Seifu Nankai Jr. & Sr. High School

2018 IEEE 2nd Electron Devices Technology and Manufacturing Conference (EDTM) ◽

10.1109/edtm.2018.8421531 ◽

2018 ◽

Author(s):

Genki Horie ◽

Yusuke Morita ◽

Shota Yamashita ◽

Hideki Yoshikado ◽

Ryotaro Kobayashi ◽

...

Keyword(s):

High School

Download Full-text

2018 IEEE 2nd Electron Devices Technology and Manufacturing Conference (EDTM)Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Particle removal characteristics in liquid flow during wafer rotation

Device Design Parameter for Desired DC Gain and Hysteresis-Free FDSOI NCFETs

Energy and Area Efficient Tunnel FET-based Spiking Neural Networks

Quadrupole-electrode-integrated micropores for selective single-particle detections

Ultra-high-efficient Writing in Voltage-Control Spintronics Memory(VoCSM); the Most Promising Embedded Memory for Deep Learning

Radio-frequency Superiority of Poly-Si TFTs with T-Shaped Gate and Air Spacers for IoT Applications

Atomic Layer Etching: Benefits and Challenges

Soft Error Rate from Planar to FinFETs On Bulk Vs SOI Processes

Short Flow Characterization Vehicle (Test Chip) Usage in Advanced Technology Development and Yield Improvement

Introduction of Seifu Nankai Jr. & Sr. High School

2018 IEEE 2nd Electron Devices Technology and Manufacturing Conference (EDTM)
Latest Publications