Two-step Electrical Degradation Behavior in α-InGaZnO Thin-film Transistor Under Gate-bias Stress

2013 ◽  
Vol 34 (5) ◽  
pp. 635-637 ◽  
Author(s):  
Fa-Hsyang Chen ◽  
Tung-Ming Pan ◽  
Ching-Hung Chen ◽  
Jiang-Hung Liu ◽  
Wu-Hsiung Lin ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistor ◽  
Gate Bias ◽  
Degradation Behavior ◽  
Bias Stress ◽  
Electrical Degradation ◽  
Gate Bias Stress

Investigating the degradation behavior caused by charge trapping effect under DC and AC gate-bias stress for InGaZnO thin film transistor

2011 ◽  
Vol 99 (2) ◽  
pp. 022104 ◽  
Author(s):  
Te-Chih Chen ◽  
Ting-Chang Chang ◽  
Tien-Yu Hsieh ◽  
Wei-Siang Lu ◽  
Fu-Yen Jian ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistor ◽  
Charge Trapping ◽  
Gate Bias ◽  
Degradation Behavior ◽  
Bias Stress ◽  
Trapping Effect ◽  
Gate Bias Stress

Degradation behavior and degradation mechanism of bridged-grain polycrystalline silicon thin film transistors under AC gate bias stress

2017 ◽  
Vol 32 (2) ◽  
pp. 91-96
Author(s):  
张猛 ZHANG Meng ◽  
夏之荷 XIA Zhi-he ◽  
周玮 ZHOU Wei ◽  
陈荣盛 CHEN Rong-sheng ◽  
王文 WONG Man ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Polycrystalline Silicon ◽  
Degradation Mechanism ◽  
Gate Bias ◽  
Degradation Behavior ◽  
Silicon Thin Film ◽  
Bias Stress ◽  
Gate Bias Stress

Impacts of O₂ Plasma on Negative Gate Bias Stress Instability of Tunnel Thin-Film Transistor

2020 ◽  
pp. 1-6
Author(s):  
William Cheng-Yu Ma ◽  
Po-Jen Chen ◽  
Yan-Shiuan Chang ◽  
Jhe-Wei Jhu ◽  
Ting-Hsuan Chang
Keyword(s):  
Thin Film ◽  
Thin Film Transistor ◽  
Gate Bias ◽  
Bias Stress ◽  
Gate Bias Stress

Influence of white light illumination on the performance of a-IGZO thin film transistor under positive gate-bias stress

2015 ◽  
Vol 24 (8) ◽  
pp. 088504 ◽  
Author(s):  
Lan-Feng Tang ◽  
Guang Yu ◽  
Hai Lu ◽  
Chen-Fei Wu ◽  
Hui-Min Qian ◽  
...  
Keyword(s):  
Thin Film ◽  
White Light ◽  
Thin Film Transistor ◽  
Light Illumination ◽  
Gate Bias ◽  
Bias Stress ◽  
White Light Illumination ◽  
Gate Bias Stress

Anomalous degradation behaviors under illuminated gate bias stress in a-Si:H thin film transistor

2014 ◽  
Vol 572 ◽  
pp. 79-84 ◽  
Author(s):  
Ming-Yen Tsai ◽  
Ting-Chang Chang ◽  
Ann-Kuo Chu ◽  
Tien-Yu Hsieh ◽  
Kun-Yao Lin ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistor ◽  
Gate Bias ◽  
Bias Stress ◽  
Degradation Behaviors ◽  
Gate Bias Stress
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