Investigating degradation behavior of hole-trapping effect under static and dynamic gate-bias stress in a dual gate a-InGaZnO thin film transistor with etch stop layer

2016 ◽  
Vol 603 ◽  
pp. 359-362 ◽  
Author(s):  
Po-Yung Liao ◽  
Ting-Chang Chang ◽  
Tien-Yu Hsieh ◽  
Ming-Yen Tsai ◽  
Bo-Wei Chen ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistor ◽  
Gate Bias ◽  
Degradation Behavior ◽  
Bias Stress ◽  
Hole Trapping ◽  
Trapping Effect ◽  
Dual Gate ◽  
Etch Stop ◽  
Etch Stop Layer

Investigating the degradation behavior caused by charge trapping effect under DC and AC gate-bias stress for InGaZnO thin film transistor

2011 ◽  
Vol 99 (2) ◽  
pp. 022104 ◽  
Author(s):  
Te-Chih Chen ◽  
Ting-Chang Chang ◽  
Tien-Yu Hsieh ◽  
Wei-Siang Lu ◽  
Fu-Yen Jian ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistor ◽  
Charge Trapping ◽  
Gate Bias ◽  
Degradation Behavior ◽  
Bias Stress ◽  
Trapping Effect ◽  
Gate Bias Stress

Two-step Electrical Degradation Behavior in α-InGaZnO Thin-film Transistor Under Gate-bias Stress

2013 ◽  
Vol 34 (5) ◽  
pp. 635-637 ◽  
Author(s):  
Fa-Hsyang Chen ◽  
Tung-Ming Pan ◽  
Ching-Hung Chen ◽  
Jiang-Hung Liu ◽  
Wu-Hsiung Lin ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistor ◽  
Gate Bias ◽  
Degradation Behavior ◽  
Bias Stress ◽  
Electrical Degradation ◽  
Gate Bias Stress

Investigating Degradation Behavior of InGaZnO Thin-Film Transistors Induced by Charge-Trapping Effect under DC and AC Gate-Bias Stress

2012 ◽  
Vol 45 (7) ◽  
pp. 133-140 ◽  
Author(s):  
T.-Y. Hsieh ◽  
T.-C. Chang ◽  
T.-C. Chen ◽  
M.-Y. Tsai ◽  
Y.-T. Chen ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Charge Trapping ◽  
Gate Bias ◽  
Degradation Behavior ◽  
Bias Stress ◽  
Trapping Effect ◽  
Gate Bias Stress

scholarly journals Effect of top gate potential on bias-stress for dual gate amorphous indium-gallium-zinc-oxide thin film transistor

AIP Advances ◽  
2016 ◽  
Vol 6 (7) ◽  
pp. 075217 ◽  
Author(s):  
Minkyu Chun ◽  
Jae Gwang Um ◽  
Min Sang Park ◽  
Md Delwar Hossain Chowdhury ◽  
Jin Jang
Keyword(s):  
Thin Film ◽  
Zinc Oxide ◽  
Thin Film Transistor ◽  
Oxide Thin Film ◽  
Indium Gallium Zinc Oxide ◽  
Zinc Oxide Thin Film ◽  
Bias Stress ◽  
Dual Gate ◽  
Gate Potential ◽  
Indium Gallium

Degradation behavior and degradation mechanism of bridged-grain polycrystalline silicon thin film transistors under AC gate bias stress

2017 ◽  
Vol 32 (2) ◽  
pp. 91-96
Author(s):  
张猛 ZHANG Meng ◽  
夏之荷 XIA Zhi-he ◽  
周玮 ZHOU Wei ◽  
陈荣盛 CHEN Rong-sheng ◽  
王文 WONG Man ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Polycrystalline Silicon ◽  
Degradation Mechanism ◽  
Gate Bias ◽  
Degradation Behavior ◽  
Silicon Thin Film ◽  
Bias Stress ◽  
Gate Bias Stress

Impacts of O₂ Plasma on Negative Gate Bias Stress Instability of Tunnel Thin-Film Transistor

2020 ◽  
pp. 1-6
Author(s):  
William Cheng-Yu Ma ◽  
Po-Jen Chen ◽  
Yan-Shiuan Chang ◽  
Jhe-Wei Jhu ◽  
Ting-Hsuan Chang
Keyword(s):  
Thin Film ◽  
Thin Film Transistor ◽  
Gate Bias ◽  
Bias Stress ◽  
Gate Bias Stress
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