Spatially resolving the hot carrier degradations of poly-Si thin-film transistors using a novel test structure

2006 ◽  
Vol 27 (7) ◽  
pp. 561-563 ◽  
Author(s):  
Horng-Chih Lin ◽  
Ming-Hsien Lee ◽  
Kai-Hsiang Chang
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Test Structure ◽  
Hot Carrier ◽  
Si Thin Film

Poly-Si Thin-Film Transistors Robust Against Hot-Carrier Stress and Application to Liquid Crystal Displays Fabricated by a 450°C Process

2003 ◽  
Vol 93 ◽  
pp. 19-30
Author(s):  
Takeo Shiba ◽  
Mutsuko Hatano ◽  
Mieko Matsumura ◽  
Yoshiaki Toyota ◽  
Yoshiharu Tai ◽  
...  
Keyword(s):  
Thin Film ◽  
Liquid Crystal ◽  
Thin Film Transistors ◽  
Liquid Crystal Displays ◽  
Hot Carrier ◽  
Hot Carrier Stress ◽  
Si Thin Film

Analysis of Drain Field and Hot Carrier Stability of Poly-Si Thin Film Transistors

1998 ◽  
Vol 37 (Part 1, No. 4A) ◽  
pp. 1801-1808 ◽  
Author(s):  
J. Richard Ayres ◽  
Stan D. Brotherton ◽  
David J. McCulloch ◽  
Michael J. Trainor
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Hot Carrier ◽  
Drain Field ◽  
Si Thin Film

Characterization of AC Hot-Carrier Effects in Poly-Si Thin-Film Transistors

2009 ◽  
Vol 56 (11) ◽  
pp. 2664-2669
Author(s):  
Horng-Chih Lin ◽  
Kai-Hsiang Chang ◽  
Tiao-Yuan Huang
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Hot Carrier ◽  
Hot Carrier Effects ◽  
Si Thin Film
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