2011 IEEE 6th International Design and Test Workshop (IDT)
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9781467304696, 9781467304689, 9781467304672

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Survey of fault tolerance techniques for shared memory multicore/multiprocessor systems

2011 IEEE 6th International Design and Test Workshop (IDT) ◽

10.1109/idt.2011.6123094 ◽

2011 ◽

Cited By ~ 14

Author(s):

Hamid Mushtaq ◽

Zaid Al-Ars ◽

Koen Bertels

Keyword(s):

Fault Tolerance ◽

Shared Memory ◽

Multiprocessor Systems

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Analog performance prediction based on archimedean copulas generation algorithm

2011 IEEE 6th International Design and Test Workshop (IDT) ◽

10.1109/idt.2011.6123095 ◽

2011 ◽

Author(s):

Kamel Beznia ◽

Ahcene Bounceur ◽

Reinhardt Euler

Keyword(s):

Performance Prediction ◽

Archimedean Copulas ◽

Generation Algorithm ◽

Analog Performance

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Body contact based TSV equalizer

2011 IEEE 6th International Design and Test Workshop (IDT) ◽

10.1109/idt.2011.6123113 ◽

2011 ◽

Cited By ~ 1

Author(s):

Khaled Mohamed ◽

Alaa Elrouby ◽

Yehea Ismail ◽

Hani Ragai

Keyword(s):

Body Contact

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Performance and functional test of flip-flops using ring oscillator structure

2011 IEEE 6th International Design and Test Workshop (IDT) ◽

10.1109/idt.2011.6123099 ◽

2011 ◽

Cited By ~ 1

Author(s):

Renato P. Ribas ◽

Andre I. Reis ◽

Andre Ivanov

Keyword(s):

Ring Oscillator ◽

Functional Test

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The effectiveness of delay and IDDT tests in detecting resistive open defects for nanometer CMOS adder circuits

2011 IEEE 6th International Design and Test Workshop (IDT) ◽

10.1109/idt.2011.6123101 ◽

2011 ◽

Cited By ~ 4

Author(s):

Layla Hamieh ◽

Nader Mehdi ◽

Ghazalah Omeirat ◽

Ali Chehab ◽

Ayman Kayssi

Keyword(s):

Nanometer Cmos ◽

Open Defects ◽

Resistive Open Defects

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Bipolar OxRRAM memory array reliability evaluation based on fault injection

2011 IEEE 6th International Design and Test Workshop (IDT) ◽

10.1109/idt.2011.6123106 ◽

2011 ◽

Cited By ~ 12

Author(s):

H. Aziza ◽

M. Bocquet ◽

J-M. Portal ◽

C. Muller

Keyword(s):

Fault Injection ◽

Reliability Evaluation ◽

Memory Array

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Fault detection and diagnoses methodology for adaptive digitally-calibrated pipelined ADCs

2011 IEEE 6th International Design and Test Workshop (IDT) ◽

10.1109/idt.2011.6123097 ◽

2011 ◽

Cited By ~ 2

Author(s):

Mohamed Abbas

Keyword(s):

Fault Detection ◽

Pipelined Adcs

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4-D parity codes for soft error correction in aerospace applications

2011 IEEE 6th International Design and Test Workshop (IDT) ◽

10.1109/idt.2011.6123111 ◽

2011 ◽

Cited By ~ 1

Author(s):

Muhammad Imran ◽

Zaid Al-Ars ◽

Georgi N. Gaydadjiev

Keyword(s):

Error Correction ◽

Soft Error ◽

Aerospace Applications

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A Python-based layout-aware analog design methodology for nanometric technologies

2011 IEEE 6th International Design and Test Workshop (IDT) ◽

10.1109/idt.2011.6123103 ◽

2011 ◽

Cited By ~ 11

Author(s):

Stephanie Youssef ◽

Farakh Javid ◽

Damien Dupuis ◽

Ramy Iskander ◽

Marie-Minerve Louerat

Keyword(s):

Design Methodology ◽

Analog Design

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IDT 2011 keyword index

2011 IEEE 6th International Design and Test Workshop (IDT) ◽

10.1109/idt.2011.6123117 ◽

2011 ◽

Keyword(s):

Keyword Index

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2011 IEEE 6th International Design and Test Workshop (IDT)Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Survey of fault tolerance techniques for shared memory multicore/multiprocessor systems

Analog performance prediction based on archimedean copulas generation algorithm

Body contact based TSV equalizer

Performance and functional test of flip-flops using ring oscillator structure

The effectiveness of delay and IDDT tests in detecting resistive open defects for nanometer CMOS adder circuits

Bipolar OxRRAM memory array reliability evaluation based on fault injection

Fault detection and diagnoses methodology for adaptive digitally-calibrated pipelined ADCs

4-D parity codes for soft error correction in aerospace applications

A Python-based layout-aware analog design methodology for nanometric technologies

IDT 2011 keyword index

2011 IEEE 6th International Design and Test Workshop (IDT)
Latest Publications