On the Self-Limiting Hot-Carrier Degradation Mechanism in Ultra-deep Submicrometer Lightly-doped-drain NMOSFET's

2006 ◽  
Author(s):  
Chun-li Yu ◽  
Yue Hao ◽  
Lin-an Yang
Keyword(s):  
Degradation Mechanism ◽  
The Self ◽  
Hot Carrier ◽  
Deep Submicrometer ◽  
Lightly Doped Drain ◽  
Hot Carrier Degradation

Hot-carrier degradation mechanism in narrow- and wide-channel n-MOSFETs with recessed LOCOS isolation structure

2000 ◽  
Vol 21 (3) ◽  
pp. 130-132 ◽  
Author(s):  
Jeffrey Mun Pun Yue ◽  
Wai Kin Chim ◽  
Byung Jin Cho ◽  
Daniel Sin Hung Chan ◽  
Wei Han Qin ◽  
...  
Keyword(s):  
Degradation Mechanism ◽  
Hot Carrier ◽  
Wide Channel ◽  
Hot Carrier Degradation

Hot-carrier degradation mechanism for p-type symmetric LDMOS transistor with thick gate oxide

2012 ◽  
Vol 48 (24) ◽  
pp. 1545-1546 ◽  
Author(s):  
Siyang Liu ◽  
Qinsong Qian ◽  
Weijun Wan ◽  
Tingting Huang ◽  
Weifeng Sun
Keyword(s):  
Degradation Mechanism ◽  
Gate Oxide ◽  
Hot Carrier ◽  
P Type ◽  
Hot Carrier Degradation
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