A new assessment of the self-limiting hot-carrier degradation in LDD NMOSFET's by charge pumping measurement

1997 ◽  
Vol 18 (6) ◽  
pp. 299-301 ◽  
Author(s):  
D.S. Ang ◽  
C.H. Ling
Keyword(s):  
The Self ◽  
Charge Pumping ◽  
Hot Carrier ◽  
Hot Carrier Degradation

ANALYSIS OF HOT CARRIER DEGRADATION IN AC STRESSED N-CHANNEL MOS TRANSISTORS USING THE CHARGE PUMPING TECHNIQUE

1988 ◽  
Vol 49 (C4) ◽  
pp. C4-651-C4-655 ◽  
Author(s):  
R. BELLENS ◽  
P. HEREMANS ◽  
G. GROESENEKEN ◽  
H. E. MAES
Keyword(s):  
Mos Transistors ◽  
Charge Pumping ◽  
Hot Carrier ◽  
Hot Carrier Degradation

Quantifying Region-Specific Hot Carrier Degradation in LDMOS Transistors Using a Novel Charge Pumping Technique

2021 ◽  
Author(s):  
Bikram Kishore Mahajan ◽  
Yen-Pu Chen ◽  
Dhanoop Varghese ◽  
Vijay Reddy ◽  
Srikanth Krishnan ◽  
...  
Keyword(s):  
Charge Pumping ◽  
Hot Carrier ◽  
Hot Carrier Degradation
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