Accurate fault modeling and fault simulation of resistive bridges

2002 ◽  
Author(s):  
V. Sar-Dessai ◽  
D.M.H. Walker
Keyword(s):  
Fault Simulation ◽  
Fault Modeling ◽  
Resistive Bridges

Improved Parasitic Fault Modeling for Automatic Analog Fault Simulation

2012 ◽  
Author(s):  
Gerhard Borgmann ◽  
Christian Burmer ◽  
Sébastien Mézière
Keyword(s):  
Light Emission ◽  
Fault Simulation ◽  
Fault Modeling ◽  
Fault Model ◽  
Time Resolved ◽  
Analog Simulation ◽  
Layout Extraction ◽  
Analog Fault Simulation

Abstract Analog simulation combined with Time Resolved Light Emission (TRE) can be used to evaluate different fault possibilities and to isolate the most likely fault candidate. In this paper we will describe an improved fault model derived from parasitic layout extraction.

Hierarchical specification-driven analog fault modeling for efficient fault simulation and diagnosis

2002 ◽  
Author(s):  
R. Voorakaranam ◽  
S. Chakrabarti ◽  
J. Hou ◽  
A. Gomes ◽  
S. Cherubal ◽  
...  
Keyword(s):  
Fault Simulation ◽  
Fault Modeling

A Manual Diagnosis Approach Using Targeted Fault Injection and Fault Simulation to Extend ATPG Diagnostic Resolution in Localizing Faults

2019 ◽  
Author(s):  
Rommel Estores ◽  
Karo Vander Gucht
Keyword(s):  
Fault Injection ◽  
Fault Simulation ◽  
Fault Localization ◽  
Pattern Generation ◽  
Test Coverage ◽  
Actual Case ◽  
Electrical Failure ◽  
Starting Point ◽  
Diagnostic Resolution ◽  
Diagnosis Approach

Abstract This paper discusses a creative manual diagnosis approach, a complementary technique that provides the possibility to extend Automatic Test Pattern Generation (ATPG) beyond its own limits. The authors will discuss this approach in detail using an actual case – a test coverage issue where user-generated ATPG patterns and the resulting ATPG diagnosis isolated the fault to a small part of the digital core. However, traditional fault localization techniques was unable to isolate the fault further. Using the defect candidates from ATPG diagnosis as a starting point, manual diagnosis through fault Injection and fault simulation was performed. Further fault localization was performed using the ‘not detected’ (ND) and/or ‘detected’ (DT) fault classes for each of the available patterns. The result has successfully deduced the defect candidates until the exact faulty net causing the electrical failure was identified. The ability of the FA lab to maximize the use of ATPG in combination with other tools/techniques to investigate failures in detail; is crucial in the fast root cause determination and, in case of a test coverage, aid in having effective test screen method implemented.

Case Study and Fault Modeling for Wrong Redundancy Evaluation on DRAM Devices

2007 ◽  
Author(s):  
Martin Versen ◽  
Dorina Diaconescu ◽  
Jerome Touzel
Keyword(s):  
Failure Mode ◽  
Failure Modes ◽  
Fault Modeling ◽  
Mode Analysis ◽  
Root Cause ◽  
Failure Mode Analysis

Abstract The characterization of failure modes of DRAM is often straight forward if array related hard failures with specific addresses for localization are concerned. The paper presents a case study of a bitline oriented failure mode connected to a redundancy evaluation in the DRAM periphery. The failure mode analysis and fault modeling focus both on the root-cause and on the test aspects of the problem.

Diagnostic Fault Simulation for the Failure Analyst

2004 ◽  
Author(s):  
Dan Bodoh ◽  
Anthony Blakely ◽  
Terry Garyet
Keyword(s):  
Fault Diagnosis ◽  
Failure Analysis ◽  
Complete Solution ◽  
Fault Simulation ◽  
Building Blocks ◽  
Physical World ◽  
Design For Test ◽  
Fault Diagnosis System ◽  
Diagnosis Algorithm ◽  
Diagnosis Tool

Abstract Since failure analysis (FA) tools originated in the design-for-test (DFT) realm, most have abstractions that reflect a designer's viewpoint. These abstractions prevent easy application of diagnosis results in the physical world of the FA lab. This article presents a fault diagnosis system, DFS/FA, which bridges the DFT and FA worlds. First, it describes the motivation for building DFS/FA and how it is an improvement over off-the-shelf tools and explains the DFS/FA building blocks on which the diagnosis tool depends. The article then discusses the diagnosis algorithm in detail and provides an overview of some of the supporting tools that make DFS/FA a complete solution for FA. It also presents a FA example where DFS/FA has been applied. The example demonstrates how the consideration of physical proximity improves the accuracy without sacrificing precision.

scholarly journals Opak Strike Slip Fault Modeling Interpretation Using Photogrammetry Method of Drone Survey in Trimulyo, Bantul, Yogyakarta Province

2021 ◽  
Vol 789 (1) ◽  
pp. 012066
Author(s):  
Ardhan Farisan ◽  
Eko Puswanto ◽  
Deasy Arisa ◽  
Mohammad Al Afif ◽  
Wisnu Priyanto ◽  
...  
Keyword(s):  
Fault Modeling ◽  
Strike Slip ◽  
Strike Slip Fault
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