analog fault simulation
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Improved Parasitic Fault Modeling for Automatic Analog Fault Simulation

2012 ◽  
Author(s):  
Gerhard Borgmann ◽  
Christian Burmer ◽  
Sébastien Mézière
Keyword(s):  
Light Emission ◽  
Fault Simulation ◽  
Fault Modeling ◽  
Fault Model ◽  
Time Resolved ◽  
Analog Simulation ◽  
Layout Extraction ◽  
Analog Fault Simulation

Abstract Analog simulation combined with Time Resolved Light Emission (TRE) can be used to evaluate different fault possibilities and to isolate the most likely fault candidate. In this paper we will describe an improved fault model derived from parasitic layout extraction.

Combining Time Resolved Emission and Analog Simulation for Fault Localization

2010 ◽  
Author(s):  
Christian Burmer ◽  
Fabian Hopsch ◽  
Wolfgang Vermeiren
Keyword(s):  
Software Package ◽  
Fault Simulation ◽  
Photon Emission ◽  
Fault Localization ◽  
Time Resolved ◽  
Analog Simulation ◽  
Localization Strategy ◽  
User Friendly ◽  
Analog Fault Simulation

Abstract In this paper, we describe a fault localization strategy for scan designs based on Time Resolved Photon Emission (TRE) and analog simulation. After characterizing the defect’s electrical footprint using TRE, analog fault simulation is applied. A user - friendly software package with an easy to use interface to scan diagnosis, layout tool and simulator was created.

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