Proceedings 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Cat. No.98EX223)
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A systematic approach for diagnosing multiple delay faults

Proceedings 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Cat. No.98EX223) ◽

10.1109/dftvs.1998.732168 ◽

2002 ◽

Cited By ~ 15

Author(s):

J.G. Dastidar ◽

N.A. Touba

Keyword(s):

Systematic Approach ◽

Delay Faults ◽

Multiple Delay

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Reducing fault sensitivity of microprocessor-based systems by modifying workload structure

Proceedings 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Cat. No.98EX223) ◽

10.1109/dftvs.1998.732172 ◽

2002 ◽

Cited By ~ 6

Author(s):

D. Audet ◽

S. Masson ◽

Y. Savaria

Keyword(s):

Fault Sensitivity

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A system for evaluating on-line testability at the RT-level

Proceedings 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Cat. No.98EX223) ◽

10.1109/dftvs.1998.732177 ◽

2002 ◽

Author(s):

S. Chiusano ◽

F. Corno ◽

M.S. Reorda ◽

R. Viettie

Keyword(s):

On Line

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Systematic AUED codes for self-checking architectures

Proceedings 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Cat. No.98EX223) ◽

10.1109/dftvs.1998.732165 ◽

2002 ◽

Cited By ~ 1

Author(s):

D. Sciuto ◽

C. Silvano ◽

R. Stefanelli

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FPGA design for decimeter scale integration (DMSI)

Proceedings 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Cat. No.98EX223) ◽

10.1109/dftvs.1998.732152 ◽

2002 ◽

Cited By ~ 1

Author(s):

G.H. Chapman

Keyword(s):

Fpga Design ◽

Scale Integration

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Binning for IC quality: experimental studies on the SEMATECH data

Proceedings 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Cat. No.98EX223) ◽

10.1109/dftvs.1998.732145 ◽

2002 ◽

Cited By ~ 7

Author(s):

D. Singh ◽

D.R. Lakin ◽

P. Nigh

Keyword(s):

Experimental Studies

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An integrated HW and SW fault injection environment for real-time systems

Proceedings 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Cat. No.98EX223) ◽

10.1109/dftvs.1998.732158 ◽

2002 ◽

Cited By ~ 10

Author(s):

A. Benso ◽

M. Rebaudengo ◽

M.S. Reorda ◽

P.L. Civera

Keyword(s):

Real Time ◽

Fault Injection ◽

Real Time Systems ◽

Time Systems

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Functional verification coverage vs. physical stuck-at fault coverage

Proceedings 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Cat. No.98EX223) ◽

10.1109/dftvs.1998.732157 ◽

2002 ◽

Author(s):

Xiao Sun ◽

C. Hull

Keyword(s):

Fault Coverage ◽

Functional Verification

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Challenges of built-in current sensor designs

Proceedings 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Cat. No.98EX223) ◽

10.1109/dftvs.1998.732166 ◽

2002 ◽

Author(s):

Yu-Yau Guo ◽

Jien-Chung Lo

Keyword(s):

Current Sensor

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A new method for testing EEPLAs

Proceedings 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Cat. No.98EX223) ◽

10.1109/dftvs.1998.732161 ◽

2002 ◽

Author(s):

A. Munshi ◽

F.J. Meyer ◽

F. Lombardi

Keyword(s):

New Method

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Proceedings 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Cat. No.98EX223)Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

A systematic approach for diagnosing multiple delay faults

Reducing fault sensitivity of microprocessor-based systems by modifying workload structure

A system for evaluating on-line testability at the RT-level

Systematic AUED codes for self-checking architectures

FPGA design for decimeter scale integration (DMSI)

Binning for IC quality: experimental studies on the SEMATECH data

An integrated HW and SW fault injection environment for real-time systems

Functional verification coverage vs. physical stuck-at fault coverage

Challenges of built-in current sensor designs

A new method for testing EEPLAs

Proceedings 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Cat. No.98EX223)
Latest Publications