Parameterized Critical Path Selection for Delay Fault Testing

2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems ◽

10.1109/ddecs.2015.62 ◽

2015 ◽

Cited By ~ 1

Author(s):

Miroslav Siebert ◽

Elena Gramatova

Keyword(s):

Critical Path ◽

Path Selection ◽

Fault Testing ◽

Delay Fault ◽

Delay Fault Testing ◽

Selection For ◽

Critical Path Selection

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Critical Path Selection for Delay Fault Testing Based Upon a Statistical Timing Model

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/tcad.2004.835137 ◽

2004 ◽

Vol 23 (11) ◽

pp. 1550-1565 ◽

Cited By ~ 75

Author(s):

L.-C. Wang ◽

J.-J. Liou ◽

K.-T. Cheng

Keyword(s):

Critical Path ◽

Path Selection ◽

Fault Testing ◽

Delay Fault ◽

Delay Fault Testing ◽

Timing Model ◽

Selection For ◽

Statistical Timing ◽

Critical Path Selection

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On path selection for delay fault testing considering operating conditions [logic IC testing]

The Eighth IEEE European Test Workshop, 2003. Proceedings. ◽

10.1109/etw.2003.1231681 ◽

2004 ◽

Cited By ~ 8

Author(s):

B. Seshadri ◽

I. Pomeranz ◽

S.M. Reddy ◽

S. Kundu

Keyword(s):

Path Selection ◽

Operating Conditions ◽

Fault Testing ◽

Delay Fault ◽

Delay Fault Testing ◽

Selection For ◽

Ic Testing

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Recursive Path Selection for Delay Fault Testing

2009 27th IEEE VLSI Test Symposium ◽

10.1109/vts.2009.50 ◽

2009 ◽

Cited By ~ 4

Author(s):

Jaeyong Chung ◽

Jacob A. Abraham

Keyword(s):

Path Selection ◽

Fault Testing ◽

Delay Fault ◽

Delay Fault Testing ◽

Selection For ◽

Recursive Path

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On theoretical and practical considerations of path selection for delay fault testing

IEEE/ACM International Conference on Computer Aided Design, 2002. ICCAD 2002. ◽

10.1145/774572.774586 ◽

2002 ◽

Cited By ~ 1

Author(s):

Jing-Jia Liou ◽

Li-C. Wang ◽

Kwang-Ting Cheng

Keyword(s):

Path Selection ◽

Fault Testing ◽

Delay Fault ◽

Delay Fault Testing ◽

Selection For

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Effective path selection for delay fault testing of sequential circuits

Proceedings International Test Conference 1997 ◽

10.1109/test.1997.639716 ◽

2002 ◽

Cited By ~ 14

Author(s):

T.J. Chakraborty ◽

V.D. Agrawal

Keyword(s):

Path Selection ◽

Sequential Circuits ◽

Fault Testing ◽

Delay Fault ◽

Delay Fault Testing ◽

Selection For ◽

Effective Path

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On theoretical and practical considerations of path selection for delay fault testing

IEEE/ACM International Conference on Computer Aided Design, 2002. ICCAD 2002. ◽

10.1109/iccad.2002.1167519 ◽

2003 ◽

Cited By ~ 14

Author(s):

Jing-Jia Liou ◽

L.-C. Wang ◽

Kwang-Ting Cheng

Keyword(s):

Path Selection ◽

Fault Testing ◽

Delay Fault ◽

Delay Fault Testing ◽

Selection For

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Experience in critical path selection for deep sub-micron delay test and timing validation

Proceedings of the ASP-DAC Asia and South Pacific Design Automation Conference, 2003. ◽

10.1109/aspdac.2003.1195120 ◽

2003 ◽

Cited By ~ 3

Author(s):

Jing-Jia Liou ◽

L.-C. Wang ◽

A. Krstic ◽

Kwang-Ting Cheng

Keyword(s):

Critical Path ◽

Path Selection ◽

Delay Test ◽

Selection For ◽

Critical Path Selection

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Investigation of critical path selection for in-situ monitors insertion

2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS) ◽

10.1109/iolts.2017.8046229 ◽

2017 ◽

Cited By ~ 1

Author(s):

F. Cacho ◽

A. Benhassain ◽

R. Shah ◽

S. Mhira ◽

V. Huard ◽

...

Keyword(s):

Critical Path ◽

Path Selection ◽

Selection For ◽

Critical Path Selection

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A flexible path selection procedure for path delay fault testing

Proceedings 17th IEEE VLSI Test Symposium (Cat. No.PR00146) ◽

10.1109/vtest.1999.766659 ◽

2003 ◽

Cited By ~ 5

Author(s):

I. Pomeranz ◽

S.M. Reddy

Keyword(s):

Selection Procedure ◽

Path Selection ◽

Path Delay ◽

Fault Testing ◽

Delay Fault ◽

Delay Fault Testing ◽

Path Delay Fault ◽

Path Delay Fault Testing

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Critical Path Selection for Delay Testing Considering Coupling Noise

Journal of Electronic Testing ◽

10.1007/s10836-009-5105-7 ◽

2009 ◽

Vol 25 (4-5) ◽

pp. 213-223 ◽

Cited By ~ 5

Author(s):

Rajeshwary Tayade ◽

Jacob A. Abraham

Keyword(s):

Critical Path ◽

Path Selection ◽

Delay Testing ◽

Coupling Noise ◽

Selection For ◽

Critical Path Selection

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